Preparation and characterization of BaO-TeO2 thin films obtained from tellurium(VI) alkoxide by a sol-gel method

Hiroshi Ikeda; Shigeru Fujino; Toshihisa Kajiwara

doi:10.1111/j.1551-2916.2009.03280.x

Preparation and characterization of BaO-TeO₂ thin films obtained from tellurium(VI) alkoxide by a sol-gel method

Hiroshi Ikeda, Shigeru Fujino, Toshihisa Kajiwara

Product system engineering

Research output: Contribution to journal › Article › peer-review

6 Citations (Scopus)

Abstract

BaO-TeO₂ thin films were prepared from tellurium(VI) alkoxide by a sol-gel method and their structure was investigated by X-ray diffractometry, Fourier transform infrared spectrometry, and ¹²⁵Te static nuclear magnetic resonance. Their crystallization temperature (T_c), optical transmittance, and dielectric constant were measured, and their refractive index was calculated from the transmission spectra. The results indicate that the BaO-TeO₂ thin films were composed of TeO₆ and TeO ₄ units, and had a T_c of ∼520°C, refractive index of ∼1.79, dielectric constant of ∼20. These films had a T_c higher than the glass prepared by a melt-quench method, but their refractive index and dielectric constant were lower. These differences may be due to differences in their structural units.

Original language	English
Pages (from-to)	2619-2622
Number of pages	4
Journal	Journal of the American Ceramic Society
Volume	92
Issue number	11
DOIs	https://doi.org/10.1111/j.1551-2916.2009.03280.x
Publication status	Published - Nov 1 2009

All Science Journal Classification (ASJC) codes

Ceramics and Composites
Materials Chemistry

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10.1111/j.1551-2916.2009.03280.x

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title = "Preparation and characterization of BaO-TeO2 thin films obtained from tellurium(VI) alkoxide by a sol-gel method",

abstract = "BaO-TeO2 thin films were prepared from tellurium(VI) alkoxide by a sol-gel method and their structure was investigated by X-ray diffractometry, Fourier transform infrared spectrometry, and 125Te static nuclear magnetic resonance. Their crystallization temperature (Tc), optical transmittance, and dielectric constant were measured, and their refractive index was calculated from the transmission spectra. The results indicate that the BaO-TeO2 thin films were composed of TeO6 and TeO 4 units, and had a Tc of ∼520°C, refractive index of ∼1.79, dielectric constant of ∼20. These films had a Tc higher than the glass prepared by a melt-quench method, but their refractive index and dielectric constant were lower. These differences may be due to differences in their structural units.",

author = "Hiroshi Ikeda and Shigeru Fujino and Toshihisa Kajiwara",

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T1 - Preparation and characterization of BaO-TeO2 thin films obtained from tellurium(VI) alkoxide by a sol-gel method

AU - Ikeda, Hiroshi

AU - Fujino, Shigeru

AU - Kajiwara, Toshihisa

PY - 2009/11/1

Y1 - 2009/11/1

N2 - BaO-TeO2 thin films were prepared from tellurium(VI) alkoxide by a sol-gel method and their structure was investigated by X-ray diffractometry, Fourier transform infrared spectrometry, and 125Te static nuclear magnetic resonance. Their crystallization temperature (Tc), optical transmittance, and dielectric constant were measured, and their refractive index was calculated from the transmission spectra. The results indicate that the BaO-TeO2 thin films were composed of TeO6 and TeO 4 units, and had a Tc of ∼520°C, refractive index of ∼1.79, dielectric constant of ∼20. These films had a Tc higher than the glass prepared by a melt-quench method, but their refractive index and dielectric constant were lower. These differences may be due to differences in their structural units.

AB - BaO-TeO2 thin films were prepared from tellurium(VI) alkoxide by a sol-gel method and their structure was investigated by X-ray diffractometry, Fourier transform infrared spectrometry, and 125Te static nuclear magnetic resonance. Their crystallization temperature (Tc), optical transmittance, and dielectric constant were measured, and their refractive index was calculated from the transmission spectra. The results indicate that the BaO-TeO2 thin films were composed of TeO6 and TeO 4 units, and had a Tc of ∼520°C, refractive index of ∼1.79, dielectric constant of ∼20. These films had a Tc higher than the glass prepared by a melt-quench method, but their refractive index and dielectric constant were lower. These differences may be due to differences in their structural units.

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