Abstract
BaO-TeO2 thin films were prepared from tellurium(VI) alkoxide by a sol-gel method and their structure was investigated by X-ray diffractometry, Fourier transform infrared spectrometry, and 125Te static nuclear magnetic resonance. Their crystallization temperature (Tc), optical transmittance, and dielectric constant were measured, and their refractive index was calculated from the transmission spectra. The results indicate that the BaO-TeO2 thin films were composed of TeO6 and TeO 4 units, and had a Tc of ∼520°C, refractive index of ∼1.79, dielectric constant of ∼20. These films had a Tc higher than the glass prepared by a melt-quench method, but their refractive index and dielectric constant were lower. These differences may be due to differences in their structural units.
| Original language | English |
|---|---|
| Pages (from-to) | 2619-2622 |
| Number of pages | 4 |
| Journal | Journal of the American Ceramic Society |
| Volume | 92 |
| Issue number | 11 |
| DOIs | |
| Publication status | Published - Nov 1 2009 |
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All Science Journal Classification (ASJC) codes
- Ceramics and Composites
- Materials Chemistry
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Preparation and characterization of BaO-TeO2 thin films obtained from tellurium(VI) alkoxide by a sol-gel method. / Ikeda, Hiroshi; Fujino, Shigeru; Kajiwara, Toshihisa.
In: Journal of the American Ceramic Society, Vol. 92, No. 11, 01.11.2009, p. 2619-2622.Research output: Contribution to journal › Article
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TY - JOUR
T1 - Preparation and characterization of BaO-TeO2 thin films obtained from tellurium(VI) alkoxide by a sol-gel method
AU - Ikeda, Hiroshi
AU - Fujino, Shigeru
AU - Kajiwara, Toshihisa
PY - 2009/11/1
Y1 - 2009/11/1
N2 - BaO-TeO2 thin films were prepared from tellurium(VI) alkoxide by a sol-gel method and their structure was investigated by X-ray diffractometry, Fourier transform infrared spectrometry, and 125Te static nuclear magnetic resonance. Their crystallization temperature (Tc), optical transmittance, and dielectric constant were measured, and their refractive index was calculated from the transmission spectra. The results indicate that the BaO-TeO2 thin films were composed of TeO6 and TeO 4 units, and had a Tc of ∼520°C, refractive index of ∼1.79, dielectric constant of ∼20. These films had a Tc higher than the glass prepared by a melt-quench method, but their refractive index and dielectric constant were lower. These differences may be due to differences in their structural units.
AB - BaO-TeO2 thin films were prepared from tellurium(VI) alkoxide by a sol-gel method and their structure was investigated by X-ray diffractometry, Fourier transform infrared spectrometry, and 125Te static nuclear magnetic resonance. Their crystallization temperature (Tc), optical transmittance, and dielectric constant were measured, and their refractive index was calculated from the transmission spectra. The results indicate that the BaO-TeO2 thin films were composed of TeO6 and TeO 4 units, and had a Tc of ∼520°C, refractive index of ∼1.79, dielectric constant of ∼20. These films had a Tc higher than the glass prepared by a melt-quench method, but their refractive index and dielectric constant were lower. These differences may be due to differences in their structural units.
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U2 - 10.1111/j.1551-2916.2009.03280.x
DO - 10.1111/j.1551-2916.2009.03280.x
M3 - Article
VL - 92
SP - 2619
EP - 2622
JO - Journal of the American Ceramic Society
JF - Journal of the American Ceramic Society
SN - 0002-7820
IS - 11
ER -