Abstract
Yttria stabilized zirconia (YSZ) films with the thickness of up to 12 μm were prepared on alumina and NiO-YSZ substrates by electron beam physical vapor deposition (EB-PVD). The films showed nano-scaled columnar structures depending on the substrate temperature. Electrical conductivity of the YSZ films on alumina was also investigated at the temperature between 700 and 1000°C in oxidizing atmosphere. High activation energy of the conductivity (>1.03eV) indicated that the conduction via grain boundary controlled the ionic conduction in the films prepared by EB-PVD. La0.6Sr0.4CoO 3-δ as a cathode was applied on the YSZ/NiO-YSZ in order to evaluate the performance of the YSZ electrolyte.
Original language | English |
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Pages (from-to) | 913-916 |
Number of pages | 4 |
Journal | Key Engineering Materials |
Volume | 317-318 |
Publication status | Published - Jan 1 2006 |
Externally published | Yes |
All Science Journal Classification (ASJC) codes
- Materials Science(all)
- Mechanics of Materials
- Mechanical Engineering