Preparation of YSZ electrolyte for SOFC by electron beam PVD

Tae Ho Shin, Ji Heang Yu, Shiwoo Lee, In Sub Han, Sang Kuk Woo, Byung Koog Jang, Sang Hoon Hyun

Research output: Contribution to journalArticlepeer-review

3 Citations (Scopus)

Abstract

Yttria stabilized zirconia (YSZ) films with the thickness of up to 12 μm were prepared on alumina and NiO-YSZ substrates by electron beam physical vapor deposition (EB-PVD). The films showed nano-scaled columnar structures depending on the substrate temperature. Electrical conductivity of the YSZ films on alumina was also investigated at the temperature between 700 and 1000°C in oxidizing atmosphere. High activation energy of the conductivity (>1.03eV) indicated that the conduction via grain boundary controlled the ionic conduction in the films prepared by EB-PVD. La0.6Sr0.4CoO 3-δ as a cathode was applied on the YSZ/NiO-YSZ in order to evaluate the performance of the YSZ electrolyte.

Original languageEnglish
Pages (from-to)913-916
Number of pages4
JournalKey Engineering Materials
Volume317-318
Publication statusPublished - Jan 1 2006
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • Materials Science(all)
  • Mechanics of Materials
  • Mechanical Engineering

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