Yttria stabilized zirconia (YSZ) films with the thickness of up to 12 μm were prepared on alumina and NiO-YSZ substrates by electron beam physical vapor deposition (EB-PVD). The films showed nano-scaled columnar structures depending on the substrate temperature. Electrical conductivity of the YSZ films on alumina was also investigated at the temperature between 700 and 1000°C in oxidizing atmosphere. High activation energy of the conductivity (>1.03eV) indicated that the conduction via grain boundary controlled the ionic conduction in the films prepared by EB-PVD. La0.6Sr0.4CoO 3-δ as a cathode was applied on the YSZ/NiO-YSZ in order to evaluate the performance of the YSZ electrolyte.
|Number of pages||4|
|Journal||Key Engineering Materials|
|Publication status||Published - Jan 1 2006|
All Science Journal Classification (ASJC) codes
- Materials Science(all)
- Mechanics of Materials
- Mechanical Engineering