Pressure and magnetic field effects on the valence transition of EuRh2Si2

Akihiro Mitsuda, Eigo Kishaba, Takumi Fujimoto, Kohei Oyama, Hirofumi Wada, Masaichiro Mizumaki, Naomi Kawamura, Naoki Ishimatsu

Research output: Contribution to journalArticlepeer-review

3 Citations (Scopus)

Abstract

We have measured the X-ray absorption spectra (XAS), electrical resistivity and magnetic susceptibility of EuRh2Si2, which undergoes a valence transition under high pressures. A sharp decrease in the Eu valence determined from the XAS was observed at around 70 K in the temperature dependence at P = 1.2–1.9 GPa. In the temperature dependence of electrical resistivity and magnetic susceptibility, we observed jumps associated with the temperature-induced valence transition under high pressures. The magnetoresistance detected a field-induced valence transition. The results are discussed from the thermodynamic point of view.

Original languageEnglish
Pages (from-to)427-431
Number of pages5
JournalPhysica B: Condensed Matter
Volume536
DOIs
Publication statusPublished - May 1 2018

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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