Probing of the local electric potential at the organic/dielectric interface in sub-μm thick organic single-crystals (OSCs) by the scanning Kelvin probe microscopy (SKPM) has been demonstrated. Electrical and SKPM investigations were performed at ambient conditions on electrostatically bonded sub-μm thick rubrene single-crystals on Si back-gated FET structures with SiO2 dielectric and metal source drain contacts recessed in the oxide. It was observed that SKPM can be successfully applied to map the local electric potential at the sub-μm thick single-crystal/dielectric interface under bias. This allows determining the contact and channel resistances, their bias dependences, and provides access to the intrinsic electronic transport and interfacial effects in semi-conducting single-crystals.
All Science Journal Classification (ASJC) codes
- Materials Science(all)
- Mechanics of Materials
- Mechanical Engineering