Probing technique using circular motion of a microsphere controlled by optical pressure for a nanocoordinate measuring machine

Masaki Michihata, Yuto Nagasaka, Terutake Hayashi, Yasuhiro Takaya

Research output: Contribution to journalArticle

12 Citations (Scopus)

Abstract

A new surface probing technique using the circular motion of an optically-trapped microsphere is proposed for a nanocoordinate measuring system. The probe sphere is oscillated circularly in the plane perpendicular to the probe axis and the circular orbit of the probe sphere is monitored for the detection of the position and normal vector direction of the surface. The principle of detection is based on changes in the circular orbit of the microsphere. When the probe approaches a work surface, the orbit of the probe sphere becomes elliptical. The minor-axis length and the minor-axis angle of the ellipse are then used as parameters to detect the position and normal vector direction of the surface, respectively. In this study, the circular motion probe is shown to have a resolution of position detection of 39 nm, and the accuracy of measuring a normal vector to the surface is on the order of 3 °.

Original languageEnglish
Pages (from-to)198-205
Number of pages8
JournalApplied Optics
Volume48
Issue number2
DOIs
Publication statusPublished - Jan 10 2009

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Microspheres
probes
Orbits
circular orbits
ellipses
orbits

All Science Journal Classification (ASJC) codes

  • Atomic and Molecular Physics, and Optics
  • Engineering (miscellaneous)
  • Electrical and Electronic Engineering

Cite this

Probing technique using circular motion of a microsphere controlled by optical pressure for a nanocoordinate measuring machine. / Michihata, Masaki; Nagasaka, Yuto; Hayashi, Terutake; Takaya, Yasuhiro.

In: Applied Optics, Vol. 48, No. 2, 10.01.2009, p. 198-205.

Research output: Contribution to journalArticle

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