Properties of all-Nb thin film microbridges fabricated by nanometer process

Yuichi Harada, N. Hirose, Y. Uzawa, M. Sekine, S. Yoshimori, M. Kawamura

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

We have fabricated all-Nb thin film microbridges by using newly developed nanometer process. These microbridges show the high sensitivity of the radiation detection. We have investigated the properties of microbridges by changing the bridge-region parameters.

Original languageEnglish
Pages (from-to)2555-2556
Number of pages2
JournalPhysica C: Superconductivity and its applications
Volume185-189
Issue numberPART 4
DOIs
Publication statusPublished - Dec 1 1991
Externally publishedYes

Fingerprint

Radiation
Thin films
sensitivity
radiation
thin films

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Energy Engineering and Power Technology
  • Electrical and Electronic Engineering

Cite this

Properties of all-Nb thin film microbridges fabricated by nanometer process. / Harada, Yuichi; Hirose, N.; Uzawa, Y.; Sekine, M.; Yoshimori, S.; Kawamura, M.

In: Physica C: Superconductivity and its applications, Vol. 185-189, No. PART 4, 01.12.1991, p. 2555-2556.

Research output: Contribution to journalArticle

Harada, Yuichi ; Hirose, N. ; Uzawa, Y. ; Sekine, M. ; Yoshimori, S. ; Kawamura, M. / Properties of all-Nb thin film microbridges fabricated by nanometer process. In: Physica C: Superconductivity and its applications. 1991 ; Vol. 185-189, No. PART 4. pp. 2555-2556.
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