Pulsed electrical breakdown in liquid helium in the μs range

J. Suehiro, K. Yamasaki, H. Matsuo, M. Hara, J. Gerhold

Research output: Contribution to journalArticlepeer-review

6 Citations (Scopus)

Abstract

Information about breakdown time lags under pulsed voltage stress is prerequisite to the insulation design of superconducting devices. Experiments have been carried out using a pulse generator which provides a step voltage with 200 ns rise time and a long decay time constant of more than 1 ms. The present experiments may bridge the information gap between time lag measurements in the ns range using extremely high field strengths, and existing data found with usual lightning impulse voltage. The test device is described in the paper, and some typical results are discussed in detail.

Original languageEnglish
Pages (from-to)403-406
Number of pages4
JournalIEEE Transactions on Dielectrics and Electrical Insulation
Volume1
Issue number3
DOIs
Publication statusPublished - Jun 1994

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

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