Abstract
Thin films of low molecular weight electroluminescence (EL) materials, Alq3 (aluminum tirs-8-hydoroxyquinline), TPD (N, N′-diphenyl-N, N′-bis (3methylphenyl)-(1, 1′-biphenyle)-4, 4′-diamine) were deposited by pulsed laser ablation (PLA) method using KrF excimer laser and Nd: YAG laser. Optical absorption property, surface morphology and photoluminescence of the films were investigated. Alq3 films by Nd:YAG laser show slight absorption at around 400 nm, and TPD films by either KrF laser or Nd:YAG laser showed absorption at 320 nm and 360 nm. It was found that TPD thin films for EL devices can be deposited by PLA method usig Nd:YAG laser.
Original language | English |
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Pages (from-to) | 279-284 |
Number of pages | 6 |
Journal | Materials Research Society Symposium - Proceedings |
Volume | 771 |
DOIs | |
Publication status | Published - 2003 |
Externally published | Yes |
Event | Organic and Polymeric Materials and Devices - San Francisco, CA, United States Duration: Apr 22 2003 → Apr 25 2003 |
All Science Journal Classification (ASJC) codes
- Materials Science(all)
- Condensed Matter Physics
- Mechanics of Materials
- Mechanical Engineering