Quantification by aberration corrected (S)TEM of boundaries formed by symmetry breaking phase transformations

D. Schryvers; E. K.H. Salje; M. Nishida; A. De Backer; H. Idrissi; S. Van Aert

doi:10.1016/j.ultramic.2016.12.022

Quantification by aberration corrected (S)TEM of boundaries formed by symmetry breaking phase transformations

D. Schryvers, E. K.H. Salje, M. Nishida, A. De Backer, H. Idrissi, S. Van Aert

Materials Physics and Engineering

Research output: Contribution to journal › Article › peer-review

2 Citations (Scopus)

Abstract

The present contribution gives a review of recent quantification work of atom displacements, atom site occupations and level of crystallinity in various systems and based on aberration corrected HR(S)TEM images. Depending on the case studied, picometer range precisions for individual distances can be obtained, boundary widths at the unit cell level determined or statistical evolutions of fractions of the ordered areas calculated. In all of these cases, these quantitative measures imply new routes for the applications of the respective materials.

Original language	English
Pages (from-to)	194-199
Number of pages	6
Journal	Ultramicroscopy
Volume	176
DOIs	https://doi.org/10.1016/j.ultramic.2016.12.022
Publication status	Published - May 1 2017

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Atomic and Molecular Physics, and Optics
Instrumentation

Access to Document

10.1016/j.ultramic.2016.12.022

Cite this

@article{17f226e5d05a491eaa8d5c1e994d77ed,

title = "Quantification by aberration corrected (S)TEM of boundaries formed by symmetry breaking phase transformations",

abstract = "The present contribution gives a review of recent quantification work of atom displacements, atom site occupations and level of crystallinity in various systems and based on aberration corrected HR(S)TEM images. Depending on the case studied, picometer range precisions for individual distances can be obtained, boundary widths at the unit cell level determined or statistical evolutions of fractions of the ordered areas calculated. In all of these cases, these quantitative measures imply new routes for the applications of the respective materials.",

author = "D. Schryvers and Salje, {E. K.H.} and M. Nishida and {De Backer}, A. and H. Idrissi and {Van Aert}, S.",

year = "2017",

month = may,

day = "1",

doi = "10.1016/j.ultramic.2016.12.022",

language = "English",

volume = "176",

pages = "194--199",

journal = "Ultramicroscopy",

issn = "0304-3991",

publisher = "Elsevier",

}

TY - JOUR

T1 - Quantification by aberration corrected (S)TEM of boundaries formed by symmetry breaking phase transformations

AU - Schryvers, D.

AU - Salje, E. K.H.

AU - Nishida, M.

AU - De Backer, A.

AU - Idrissi, H.

AU - Van Aert, S.

PY - 2017/5/1

Y1 - 2017/5/1

N2 - The present contribution gives a review of recent quantification work of atom displacements, atom site occupations and level of crystallinity in various systems and based on aberration corrected HR(S)TEM images. Depending on the case studied, picometer range precisions for individual distances can be obtained, boundary widths at the unit cell level determined or statistical evolutions of fractions of the ordered areas calculated. In all of these cases, these quantitative measures imply new routes for the applications of the respective materials.

AB - The present contribution gives a review of recent quantification work of atom displacements, atom site occupations and level of crystallinity in various systems and based on aberration corrected HR(S)TEM images. Depending on the case studied, picometer range precisions for individual distances can be obtained, boundary widths at the unit cell level determined or statistical evolutions of fractions of the ordered areas calculated. In all of these cases, these quantitative measures imply new routes for the applications of the respective materials.

UR - http://www.scopus.com/inward/record.url?scp=85011263112&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85011263112&partnerID=8YFLogxK

U2 - 10.1016/j.ultramic.2016.12.022

DO - 10.1016/j.ultramic.2016.12.022

M3 - Article

C2 - 28162832

AN - SCOPUS:85011263112

SN - 0304-3991

VL - 176

SP - 194

EP - 199

JO - Ultramicroscopy

JF - Ultramicroscopy

ER -

Quantification by aberration corrected (S)TEM of boundaries formed by symmetry breaking phase transformations

Abstract

All Science Journal Classification (ASJC) codes

Access to Document

Other files and links

Fingerprint

Cite this