Quantification by aberration corrected (S)TEM of boundaries formed by symmetry breaking phase transformations

D. Schryvers, E. K.H. Salje, M. Nishida, A. De Backer, H. Idrissi, S. Van Aert

Research output: Contribution to journalArticlepeer-review

2 Citations (Scopus)

Abstract

The present contribution gives a review of recent quantification work of atom displacements, atom site occupations and level of crystallinity in various systems and based on aberration corrected HR(S)TEM images. Depending on the case studied, picometer range precisions for individual distances can be obtained, boundary widths at the unit cell level determined or statistical evolutions of fractions of the ordered areas calculated. In all of these cases, these quantitative measures imply new routes for the applications of the respective materials.

Original languageEnglish
Pages (from-to)194-199
Number of pages6
JournalUltramicroscopy
Volume176
DOIs
Publication statusPublished - May 1 2017

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Instrumentation

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