Quantitative analysis between visual mismatch negativity and psychopathology scale for schizophrenia

Kazuhiko Goto, Takenao Sugi, Toshihiko Maekawa, Katuya Ogata, Yoshinobu Goto, Shozo Tobitnatsu, Masatoshi Nakatnura

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Abstract

    Visual mismatch negativity (v-MMN) in electroencephalographic (EEG) record provides an index of preattentive information processing of the brain. v-MMN is considered to reflect schizophrenia. The positive and negative syndrome scale (PANSS) is usually used in clinical diagnosis on patients with schizophrenia for estimating the degree of disorder. Tn this study, the relationship between v-MMN and PANSS was analyzed. Characteristic parameters of peaks including Nl, N2, P300, and MMN were established respectively. Estimated function was constructed by selected parameters. P300 was most significant characteristic related to all items of PANSS.

    Original languageEnglish
    Title of host publicationICCAS-SICE 2009 - ICROS-SICE International Joint Conference 2009, Proceedings
    Pages853-856
    Number of pages4
    Publication statusPublished - 2009
    EventICROS-SICE International Joint Conference 2009, ICCAS-SICE 2009 - Fukuoka, Japan
    Duration: Aug 18 2009Aug 21 2009

    Publication series

    NameICCAS-SICE 2009 - ICROS-SICE International Joint Conference 2009, Proceedings

    Other

    OtherICROS-SICE International Joint Conference 2009, ICCAS-SICE 2009
    Country/TerritoryJapan
    CityFukuoka
    Period8/18/098/21/09

    All Science Journal Classification (ASJC) codes

    • Information Systems
    • Control and Systems Engineering
    • Industrial and Manufacturing Engineering

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