Quantitative Discussion on Sensitivity to Terahertz Waves of Detectors Made of MOSFET and High-Electron Mobility Transistor

Hiromu Kojima, Haruichi Kanaya, Tanemasa Asano

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A newly developed circuit model is presented to describe detection characteristic of square law detectors made of an FET under non-quasistatic condition. Sensing performance calculated using formulae derived from the model agrees well with results of experiment carried out to detect 1.0 THz waves using InAs-channel high-electron mobility transistor (HEMT). The model predicts that HEMT offers much higher voltage sensitivity to terahertz waves than Si MOSFET even for miniaturized devices.

Original languageEnglish
Title of host publicationProceedings of the International Japan-Africa Conference on Electronics, Communications and Computations, JAC-ECC 2019
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages128-131
Number of pages4
ISBN (Electronic)9781728156170
DOIs
Publication statusPublished - Dec 2019
Event7th International Japan-Africa Conference on Electronics, Communications and Computations, JAC-ECC 2019 - Alexandria, Egypt
Duration: Dec 15 2019Dec 16 2019

Publication series

NameProceedings of the International Japan-Africa Conference on Electronics, Communications and Computations, JAC-ECC 2019

Conference

Conference7th International Japan-Africa Conference on Electronics, Communications and Computations, JAC-ECC 2019
CountryEgypt
CityAlexandria
Period12/15/1912/16/19

All Science Journal Classification (ASJC) codes

  • Computer Networks and Communications
  • Computer Science Applications
  • Electrical and Electronic Engineering
  • Control and Optimization
  • Artificial Intelligence

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    Kojima, H., Kanaya, H., & Asano, T. (2019). Quantitative Discussion on Sensitivity to Terahertz Waves of Detectors Made of MOSFET and High-Electron Mobility Transistor. In Proceedings of the International Japan-Africa Conference on Electronics, Communications and Computations, JAC-ECC 2019 (pp. 128-131). [9051237] (Proceedings of the International Japan-Africa Conference on Electronics, Communications and Computations, JAC-ECC 2019). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/JAC-ECC48896.2019.9051237