This paper describes quench time lag characteristics of NbTi mechanical PCS through which pulsed current flows. The quench of the mechanical PCS takes place when the switch current is slowly increased and exceeds a critical value IT0. On the other hand, quench of the PCS through which pulsed current flows does not occur at the moment of the instantaneous current exceeding IT0, but takes place after a time delay TD. The quench time lag TD depends on rise time and peak value of the pulsed current IP. A theoretical model is proposed to show that TD corresponds to time in which superconducting connection bridge is heated up to a critical temperature mainly by flux flow loss. TD sharply fluctuates when IP is just over the static critical current IT0, but remarkably decreases when IP is further increased. It is found that statistical characteristics of TD are well fitted to Weibull distribution function.
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Electrical and Electronic Engineering