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Raman intensity profiles of zone-folded modes in SiC: Identification of stacking sequence of 10H-SiC
S. Nakashima, T. Tomita, N. Kuwahara, T. Mitani, M. Tomobe, S. Nishizawa, H. Okumura
Research output: Contribution to journal › Article › peer-review
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(Scopus)