Raman scattering study of the guest ion motion in caged crystals

Y. Takasu, T. Hasegawa, N. Ogita, M. Udagawa, M. A. Avila, K. Suekuni, T. Takabatake, T. Yamaguchi, T. Watanabe, Y. Nemoto, T. Goto, Z. Hiroi

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

The guest ion motion has been investigated by Raman scattering for the following caged crystals: La3Pd20X6 (X=Ge, Si), X8Ga16Ge30 (X=Ba, Sr, Eu), and KOs 2O6. The observed Raman peaks have been well assigned by the polarization dependence and the first principles calculation. It has been found that the energy of the guest ion anomalously decreases with decreasing temperature for X8Ga16Ge30, La 3Pd20Ge6, and KOs2O6, where the rattling motion of the guest ion has been reported. However, such anomalous decrease has not been observed in La3Pd20Si 6 (no rattling). The origin of the energy decrease is understood by the existence of the large quartic anharmonic potential. Furthermore, the existence of carriers is important for the rattling mode.

Original languageEnglish
Title of host publicationProceedings ICT'06 - 25th International Conference on Thermoelectrics
Pages33-35
Number of pages3
DOIs
Publication statusPublished - Dec 1 2006
Externally publishedYes
EventICT'06 - 25th International Conference on Thermoelectrics - Vienna, Austria
Duration: Aug 6 2006Aug 10 2006

Publication series

NameInternational Conference on Thermoelectrics, ICT, Proceedings

Other

OtherICT'06 - 25th International Conference on Thermoelectrics
CountryAustria
CityVienna
Period8/6/068/10/06

All Science Journal Classification (ASJC) codes

  • Engineering(all)

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  • Cite this

    Takasu, Y., Hasegawa, T., Ogita, N., Udagawa, M., Avila, M. A., Suekuni, K., Takabatake, T., Yamaguchi, T., Watanabe, T., Nemoto, Y., Goto, T., & Hiroi, Z. (2006). Raman scattering study of the guest ion motion in caged crystals. In Proceedings ICT'06 - 25th International Conference on Thermoelectrics (pp. 33-35). [4133229] (International Conference on Thermoelectrics, ICT, Proceedings). https://doi.org/10.1109/ICT.2006.331263