Raman spectroscopic fingerprint of ferroelectric SrBi2Ta2O9 thin films

A rapid distinction method for fluorite and pyrochlore phases

Minoru Osada, Masato Kakihana, Masatoshi Mitsuya, Takayuki Watanabe, Hiroshi Funakubo

Research output: Contribution to journalArticle

11 Citations (Scopus)

Abstract

We present the use of Raman spectroscopy as a rapid and sensitive means for the phase characterization of ferroelectric SrBi2(Ta1-xNbx)2O9 (SBTN) thin films. It is shown that frequency shifts, together with Raman selection rules, are characteristic of layered perovskite, fluorite and pyrochlore structures, and thus the Raman spectra can be used as a fingerprint of the symmetry of the examined film. We also find the enormous potential of Raman spectroscopy to detect and quantify fractions of the fluorite and pyrochlore phases coexistent with the SBTN phase.

Original languageEnglish
JournalJapanese Journal of Applied Physics, Part 2: Letters
Volume40
Issue number8 B
Publication statusPublished - Aug 15 2001
Externally publishedYes

Fingerprint

Ferroelectric thin films
Fluorspar
fluorite
Raman spectroscopy
thin films
Perovskite
frequency shift
Ferroelectric materials
Raman scattering
Raman spectra
Thin films
symmetry

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)

Cite this

Raman spectroscopic fingerprint of ferroelectric SrBi2Ta2O9 thin films : A rapid distinction method for fluorite and pyrochlore phases. / Osada, Minoru; Kakihana, Masato; Mitsuya, Masatoshi; Watanabe, Takayuki; Funakubo, Hiroshi.

In: Japanese Journal of Applied Physics, Part 2: Letters, Vol. 40, No. 8 B, 15.08.2001.

Research output: Contribution to journalArticle

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