Raman spectroscopic fingerprint of ferroelectric SrBi2Ta2O9 thin films: A rapid distinction method for fluorite and pyrochlore phases

Minoru Osada, Masato Kakihana, Masatoshi Mitsuya, Takayuki Watanabe, Hiroshi Funakubo

Research output: Contribution to journalArticlepeer-review

13 Citations (Scopus)


We present the use of Raman spectroscopy as a rapid and sensitive means for the phase characterization of ferroelectric SrBi2(Ta1-xNbx)2O9 (SBTN) thin films. It is shown that frequency shifts, together with Raman selection rules, are characteristic of layered perovskite, fluorite and pyrochlore structures, and thus the Raman spectra can be used as a fingerprint of the symmetry of the examined film. We also find the enormous potential of Raman spectroscopy to detect and quantify fractions of the fluorite and pyrochlore phases coexistent with the SBTN phase.

Original languageEnglish
Pages (from-to)L891-L893
JournalJapanese Journal of Applied Physics, Part 2: Letters
Issue number8 B
Publication statusPublished - Aug 15 2001
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • Engineering(all)
  • Physics and Astronomy (miscellaneous)
  • Physics and Astronomy(all)

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