Ray-tracing analysis in aberration of a laterally- graded multilayer mirror

Hidekazu Mimura, Soichiro Handa, Christian Morawe, Hikaru Yokoyama, Takashi Kimura, Satoshi Matsuyama, Kazuto Yamauchi

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

A laterally- graded multilayer mirror, which has a multilayer film on a curved surface substrate, is one of the candidates of focusing elements producing an ultimate hard-X-ray beam. Aberration, which multilayer mirrors natively have, should be seriously considered when we challenge several nanometer-size X-ray beams. X-rays, inserting a multilayer structure, are reflected at a relatively large angle by the effect of interferences among X-rays slightly reflected on each boundary. However, if focal points of X-rays reflected at bottom boundary and uppermost surfaces might be different, the X-rays are not allowed to be focused at the same point. This is due to refractions inside the multilayer film. Now, there is no rigorous numerical method to determine clearly the behavior of such reflection of X-rays. In this study, we code a ray-tracing simulator to analyze such aberration effect and carry out several simulations. The results conclude that aberration of an ideal laterally- graded multilayer mirror has insignificant effects on the focused beam size.

Original languageEnglish
Pages (from-to)251-254
Number of pages4
JournalNuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
Volume616
Issue number2-3
DOIs
Publication statusPublished - May 1 2010
Externally publishedYes

Fingerprint

Ray tracing
Aberrations
ray tracing
aberration
Multilayers
Mirrors
mirrors
X rays
x rays
Multilayer films
curved surfaces
Refraction
laminates
simulators
refraction
Numerical methods
Simulators
interference
Substrates
simulation

All Science Journal Classification (ASJC) codes

  • Nuclear and High Energy Physics
  • Instrumentation

Cite this

Ray-tracing analysis in aberration of a laterally- graded multilayer mirror. / Mimura, Hidekazu; Handa, Soichiro; Morawe, Christian; Yokoyama, Hikaru; Kimura, Takashi; Matsuyama, Satoshi; Yamauchi, Kazuto.

In: Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Vol. 616, No. 2-3, 01.05.2010, p. 251-254.

Research output: Contribution to journalArticle

Mimura, Hidekazu ; Handa, Soichiro ; Morawe, Christian ; Yokoyama, Hikaru ; Kimura, Takashi ; Matsuyama, Satoshi ; Yamauchi, Kazuto. / Ray-tracing analysis in aberration of a laterally- graded multilayer mirror. In: Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 2010 ; Vol. 616, No. 2-3. pp. 251-254.
@article{47a308b81b5b409c8beef448680c6b95,
title = "Ray-tracing analysis in aberration of a laterally- graded multilayer mirror",
abstract = "A laterally- graded multilayer mirror, which has a multilayer film on a curved surface substrate, is one of the candidates of focusing elements producing an ultimate hard-X-ray beam. Aberration, which multilayer mirrors natively have, should be seriously considered when we challenge several nanometer-size X-ray beams. X-rays, inserting a multilayer structure, are reflected at a relatively large angle by the effect of interferences among X-rays slightly reflected on each boundary. However, if focal points of X-rays reflected at bottom boundary and uppermost surfaces might be different, the X-rays are not allowed to be focused at the same point. This is due to refractions inside the multilayer film. Now, there is no rigorous numerical method to determine clearly the behavior of such reflection of X-rays. In this study, we code a ray-tracing simulator to analyze such aberration effect and carry out several simulations. The results conclude that aberration of an ideal laterally- graded multilayer mirror has insignificant effects on the focused beam size.",
author = "Hidekazu Mimura and Soichiro Handa and Christian Morawe and Hikaru Yokoyama and Takashi Kimura and Satoshi Matsuyama and Kazuto Yamauchi",
year = "2010",
month = "5",
day = "1",
doi = "10.1016/j.nima.2009.11.050",
language = "English",
volume = "616",
pages = "251--254",
journal = "Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment",
issn = "0168-9002",
publisher = "Elsevier",
number = "2-3",

}

TY - JOUR

T1 - Ray-tracing analysis in aberration of a laterally- graded multilayer mirror

AU - Mimura, Hidekazu

AU - Handa, Soichiro

AU - Morawe, Christian

AU - Yokoyama, Hikaru

AU - Kimura, Takashi

AU - Matsuyama, Satoshi

AU - Yamauchi, Kazuto

PY - 2010/5/1

Y1 - 2010/5/1

N2 - A laterally- graded multilayer mirror, which has a multilayer film on a curved surface substrate, is one of the candidates of focusing elements producing an ultimate hard-X-ray beam. Aberration, which multilayer mirrors natively have, should be seriously considered when we challenge several nanometer-size X-ray beams. X-rays, inserting a multilayer structure, are reflected at a relatively large angle by the effect of interferences among X-rays slightly reflected on each boundary. However, if focal points of X-rays reflected at bottom boundary and uppermost surfaces might be different, the X-rays are not allowed to be focused at the same point. This is due to refractions inside the multilayer film. Now, there is no rigorous numerical method to determine clearly the behavior of such reflection of X-rays. In this study, we code a ray-tracing simulator to analyze such aberration effect and carry out several simulations. The results conclude that aberration of an ideal laterally- graded multilayer mirror has insignificant effects on the focused beam size.

AB - A laterally- graded multilayer mirror, which has a multilayer film on a curved surface substrate, is one of the candidates of focusing elements producing an ultimate hard-X-ray beam. Aberration, which multilayer mirrors natively have, should be seriously considered when we challenge several nanometer-size X-ray beams. X-rays, inserting a multilayer structure, are reflected at a relatively large angle by the effect of interferences among X-rays slightly reflected on each boundary. However, if focal points of X-rays reflected at bottom boundary and uppermost surfaces might be different, the X-rays are not allowed to be focused at the same point. This is due to refractions inside the multilayer film. Now, there is no rigorous numerical method to determine clearly the behavior of such reflection of X-rays. In this study, we code a ray-tracing simulator to analyze such aberration effect and carry out several simulations. The results conclude that aberration of an ideal laterally- graded multilayer mirror has insignificant effects on the focused beam size.

UR - http://www.scopus.com/inward/record.url?scp=77950846988&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=77950846988&partnerID=8YFLogxK

U2 - 10.1016/j.nima.2009.11.050

DO - 10.1016/j.nima.2009.11.050

M3 - Article

AN - SCOPUS:77950846988

VL - 616

SP - 251

EP - 254

JO - Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

JF - Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

SN - 0168-9002

IS - 2-3

ER -