Real time synchrotron X-ray observations of solidification in hypoeutectic Al-Si alloys

Kazuhiro Nogita, Hideyuki Yasuda, Arvind Prasad, Stuart D. McDonald, Tomoya Nagira, Noriaki Nakatsuka, Kentaro Uesugi, David H. Stjohn

Research output: Contribution to journalArticlepeer-review

30 Citations (Scopus)

Abstract

This paper demonstrates how recent advances in synchrotron technology have allowed for the real-time X-ray imaging of solidification in Al-Si alloys, despite the small difference in atomic number of these elements. The experiments performed at the SPring-8 synchrotron, involved imaging the solidification of Al-1wt.%Si and Al-4wt.%Si alloys under a low-temperature gradient and a cooling rate of around 0.3 C/s. The nucleation and growth of the primary aluminum grains as well as the onset of eutectic solidification were clearly observed. In the alloys containing Al-4wt.%Si, contrast was sufficient to characterize the nucleation rate and growth velocity of the aluminum grains. The importance of improving observation of solidification in the Al-Si system by increasing the time resolution during critical events is discussed.

Original languageEnglish
Pages (from-to)134-140
Number of pages7
JournalMaterials Characterization
Volume85
DOIs
Publication statusPublished - Oct 14 2013

All Science Journal Classification (ASJC) codes

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

Fingerprint Dive into the research topics of 'Real time synchrotron X-ray observations of solidification in hypoeutectic Al-Si alloys'. Together they form a unique fingerprint.

Cite this