Recent development in quantitative electron diffraction for crystallography of materials

Yoshitsugu Tomokiyo, Syo Matsumura

Research output: Contribution to journalReview article

4 Citations (Scopus)

Abstract

The present paper gives an extended review on applications of electron diffraction techniques to practical problems in materials science, such as (1) determination of structure factors and temperature factors by the critical voltage and intersecting Kikuchi line (IKL) methods, (2) measurement of local lattice parameters by convergent beam electron diffraction (CBED), (3) determination of partial degree of order in ternary alloys by IKL-ALCHEMI method, and (4) determination of structure factors by energy filtering CBED. The emphasis is placed on recent achievements of electron diffraction as a tool of quantitative crystallography of materials. Keywords: convergent beam electron diffraction, critical voltage effect, intersecting Kikuchi line method, atom location by channeling enhanced microanalysis, energy filtering, structure factor, lattice parameter, temperature factor, dynamical diffraction.

Original languageEnglish
Pages (from-to)927-937
Number of pages11
JournalMaterials Transactions, JIM
Volume39
Issue number9
DOIs
Publication statusPublished - Jan 1 1998

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Crystallography
Electron diffraction
crystallography
electron diffraction
Lattice constants
lattice parameters
Ternary alloys
ternary alloys
Microanalysis
Electric potential
electric potential
Materials science
materials science
microanalysis
Diffraction
Atoms
Temperature
temperature
energy
diffraction

All Science Journal Classification (ASJC) codes

  • Engineering(all)

Cite this

Recent development in quantitative electron diffraction for crystallography of materials. / Tomokiyo, Yoshitsugu; Matsumura, Syo.

In: Materials Transactions, JIM, Vol. 39, No. 9, 01.01.1998, p. 927-937.

Research output: Contribution to journalReview article

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