Recognizing object surface properties using impedance perception

Ryo Kikuuwe, Tsuneo Yoshikawa

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Abstract

Using the impedance perception algorithm, which we previously proposed, the stiffness matrix that constrains the motion-force relation of the robot's eudeffector is obtained on-line. This paper describes two methods of extracting information on local properties of object surfaces from the stiffness matrix when the end-effector is slid on the surfaces. At the present time, the scope is limited to two classes of surfaces; flat and convex cylindrical surfaces. Since the proposed perception technique is designed separately from control strategics, and they can be used for both autonomous and remote controlled robots. Results of preliminary experiments are presented.

Original languageEnglish
Title of host publicationMHS 2003 - Proceedings of 2003 International Symposium on Micromechatronics and Human Science
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages251-258
Number of pages8
ISBN (Electronic)0780381653, 9780780381650
DOIs
Publication statusPublished - Jan 1 2003
EventInternational Symposium on Micromechatronics and Human Science, MHS 2003 - Nagoya, Japan
Duration: Oct 19 2003Oct 22 2003

Publication series

NameMHS 2003 - Proceedings of 2003 International Symposium on Micromechatronics and Human Science

Other

OtherInternational Symposium on Micromechatronics and Human Science, MHS 2003
CountryJapan
CityNagoya
Period10/19/0310/22/03

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All Science Journal Classification (ASJC) codes

  • Biotechnology
  • Industrial and Manufacturing Engineering
  • Electrical and Electronic Engineering
  • Mechanical Engineering

Cite this

Kikuuwe, R., & Yoshikawa, T. (2003). Recognizing object surface properties using impedance perception. In MHS 2003 - Proceedings of 2003 International Symposium on Micromechatronics and Human Science (pp. 251-258). [1249944] (MHS 2003 - Proceedings of 2003 International Symposium on Micromechatronics and Human Science). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/MHS.2003.1249944