Recombination-enhanced Fe atom jump between the frist athe second neighbor site of Fe-acceptor pair in Si

S. Sakauchi, M. Suezawa, K. Sumino, Hiroshi Nakashima

    Research output: Contribution to journalArticle

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    Abstract

    We studied the recombination-enhanced Fe atom jump between the first (1st) and second (2nd) neighbor sites of Fe-Al and Fe-B pairs in Si. We first annealed specimens at 80 °C to generate Fe-acceptor pairs after doping of Fe. Concentrations of the 1st and 2nd neighbor Fe-acceptor pairs were determined by electron-spin-resonance (ESR) measurement after annealing at around 150 K under optical excitation. The concentration of the 1st neighbor pair was decreased and that of the 2nd neighbor pair was increased by the above annealing. Activation energy for the above changes was about 0.11 eV in the case of the Fe-Al pair. This is much smaller than that (0.8 eV) of thermal annealing alone. In the case of the Fe-B pair, the ESR signal of the 2nd neighbor pair could be detected due to annealing at around 160 K under optical excitation.

    Original languageEnglish
    Pages (from-to)6198-6203
    Number of pages6
    JournalJournal of Applied Physics
    Volume80
    Issue number11
    DOIs
    Publication statusPublished - Dec 1 1996

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    annealing
    atoms
    electron paramagnetic resonance
    excitation
    activation energy

    All Science Journal Classification (ASJC) codes

    • Physics and Astronomy(all)

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    Recombination-enhanced Fe atom jump between the frist athe second neighbor site of Fe-acceptor pair in Si. / Sakauchi, S.; Suezawa, M.; Sumino, K.; Nakashima, Hiroshi.

    In: Journal of Applied Physics, Vol. 80, No. 11, 01.12.1996, p. 6198-6203.

    Research output: Contribution to journalArticle

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