TY - JOUR
T1 - Rectangular wave eddy current testing using for imaging of backside defects of steel plates
AU - Sasayama, Teruyoshi
AU - Yoshimura, Wataru
AU - Enpuku, Keiji
N1 - Funding Information:
This work was supported in part by the Cross-Ministerial Strategic Innovation Promotion Program (SIP), Cabinet Office, Government of Japan, and the Iron and Steel Institute of Japan (ISIJ) Research Promotion Grant.
Publisher Copyright:
© 2020 - IOS Press and the authors. All rights reserved.
PY - 2020
Y1 - 2020
N2 - Accurate, easy, and fast inspection of defects on the backside of thick steel plates is essential for the maintenance of infrastructures. Low frequency eddy current testing (LF-ECT) is a promising method to detect defects of the backside of steel plates, with a thickness of approximately 10 mm. However, it is possible that the signal from the backside defect is smaller than that from the surface magnetic noise, causing difficulty identifying the backside defect. In this study, we propose a method to reduce the surface noise by employing a square wave inverter to generate a harmonic signal (rectangular wave ECT, or RECT), and the result demonstrates that the surface noise is successfully reduced using the harmonic signal.
AB - Accurate, easy, and fast inspection of defects on the backside of thick steel plates is essential for the maintenance of infrastructures. Low frequency eddy current testing (LF-ECT) is a promising method to detect defects of the backside of steel plates, with a thickness of approximately 10 mm. However, it is possible that the signal from the backside defect is smaller than that from the surface magnetic noise, causing difficulty identifying the backside defect. In this study, we propose a method to reduce the surface noise by employing a square wave inverter to generate a harmonic signal (rectangular wave ECT, or RECT), and the result demonstrates that the surface noise is successfully reduced using the harmonic signal.
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U2 - 10.3233/JAE-209329
DO - 10.3233/JAE-209329
M3 - Article
AN - SCOPUS:85097885852
SN - 1383-5416
VL - 64
SP - 255
EP - 262
JO - International journal of applied electromagnetics in materials
JF - International journal of applied electromagnetics in materials
IS - 1-4
ER -