TY - JOUR
T1 - Reduction of Coupling Effects by Optimizing the 3-D Configuration of the Routing Grid
AU - Sakai, Atsushi
AU - Yamada, Takashi
AU - Matsushita, Yoshifumi
AU - Yasuura, Hiroto
N1 - Copyright:
Copyright 2008 Elsevier B.V., All rights reserved.
PY - 2003/10
Y1 - 2003/10
N2 - In this brief, we propose a new physical design technique for a subquarter micrometer system-on-a-chip (SoC). By optimizing the Individual layer's routing grid space, coupling effects such as crosstalk noise, crosstalk-induced delay variations, and coupling power consumption are almost eliminated with little runtime penalty. Experiments are performed on the design of an image processing circuit using a subquarter micron CMOS process with multilayer interconnects. Simply by employing our proposed technique, the maximum delay and the power consumption can be decreased simultaneously by up to 15% and 10%, respectively, without any other process improvements.
AB - In this brief, we propose a new physical design technique for a subquarter micrometer system-on-a-chip (SoC). By optimizing the Individual layer's routing grid space, coupling effects such as crosstalk noise, crosstalk-induced delay variations, and coupling power consumption are almost eliminated with little runtime penalty. Experiments are performed on the design of an image processing circuit using a subquarter micron CMOS process with multilayer interconnects. Simply by employing our proposed technique, the maximum delay and the power consumption can be decreased simultaneously by up to 15% and 10%, respectively, without any other process improvements.
UR - http://www.scopus.com/inward/record.url?scp=0142196045&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=0142196045&partnerID=8YFLogxK
U2 - 10.1109/TVLSI.2003.817126
DO - 10.1109/TVLSI.2003.817126
M3 - Article
AN - SCOPUS:0142196045
VL - 11
SP - 951
EP - 954
JO - IEEE Transactions on Very Large Scale Integration (VLSI) Systems
JF - IEEE Transactions on Very Large Scale Integration (VLSI) Systems
SN - 1063-8210
IS - 5
ER -