Reference Model of specifications toward Independent Verification and Validation

Takahiro Ando, Hirokazu Yatsu, Kenji Hisazumi, Akira Fukuda, Michihiro Matsumoto, Yasutaka Michiura

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Independent Verification and Validation (IV&V) [1] has begun to be used in the verification phase of system development. In this paper, we present the document group which we call Reference Model that we are developing currently. The Reference Model is developed for the purpose of supporting the efficient implementation of the formal verification for requirements and design specifications in IV&V. The Reference Model shows what with formats the requirement and design specifications should be described. For developers side of IV&V, the Reference Model are useful to recognize the essential information and its notation that should be described in the document that is a target of formal verification. For verifiers side, by comparing the Reference Model and the target document of the formal verification, the Reference Models are useful to recognize which items and properties should be verified.

Original languageEnglish
Title of host publicationTENCON 2015 - 2015 IEEE Region 10 Conference
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781479986415
DOIs
Publication statusPublished - Jan 5 2016
Event35th IEEE Region 10 Conference, TENCON 2015 - Macau, Macao
Duration: Nov 1 2015Nov 4 2015

Publication series

NameIEEE Region 10 Annual International Conference, Proceedings/TENCON
Volume2016-January
ISSN (Print)2159-3442
ISSN (Electronic)2159-3450

Other

Other35th IEEE Region 10 Conference, TENCON 2015
CountryMacao
CityMacau
Period11/1/1511/4/15

All Science Journal Classification (ASJC) codes

  • Computer Science Applications
  • Electrical and Electronic Engineering

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    Ando, T., Yatsu, H., Hisazumi, K., Fukuda, A., Matsumoto, M., & Michiura, Y. (2016). Reference Model of specifications toward Independent Verification and Validation. In TENCON 2015 - 2015 IEEE Region 10 Conference [7372818] (IEEE Region 10 Annual International Conference, Proceedings/TENCON; Vol. 2016-January). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/TENCON.2015.7372818