Refractive index dispersion of gallium lanthanum sulfide and oxysulfide glasses

Hiroyuki Yayama; Shigeru Fujino; Kenji Morinaga; Hiromichi Takebe; Daniel W. Hewak; David N. Payne

doi:10.1016/S0022-3093(98)00737-6

Refractive index dispersion of gallium lanthanum sulfide and oxysulfide glasses

Hiroyuki Yayama, Shigeru Fujino, Kenji Morinaga, Hiromichi Takebe, Daniel W. Hewak, David N. Payne

Research output: Contribution to journal › Article › peer-review

36 Citations (Scopus)

Abstract

Refractive indexes were measured for Ga₂S₃-La₂S₃ and Ga₂S₃-La₂O₃ samples in the range of 0.48-1.71 nm using the minimum deviation method. Data are analyzed by the Wemple equation, which is based on the single-oscillator model. These samples have relatively large average bandgaps, E₀, and electronic oscillator strengths, E_d, in comparison with other chalcogenide glasses. Possible origins of these features are discussed.

Original language	English
Pages (from-to)	187-191
Number of pages	5
Journal	Journal of Non-Crystalline Solids
Volume	239
Issue number	1-3
DOIs	https://doi.org/10.1016/S0022-3093(98)00737-6
Publication status	Published - Oct 1 1998

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Ceramics and Composites
Condensed Matter Physics
Materials Chemistry

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abstract = "Refractive indexes were measured for Ga2S3-La2S3 and Ga2S3-La2O3 samples in the range of 0.48-1.71 nm using the minimum deviation method. Data are analyzed by the Wemple equation, which is based on the single-oscillator model. These samples have relatively large average bandgaps, E0, and electronic oscillator strengths, Ed, in comparison with other chalcogenide glasses. Possible origins of these features are discussed.",

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AU - Yayama, Hiroyuki

AU - Fujino, Shigeru

AU - Morinaga, Kenji

AU - Takebe, Hiromichi

AU - Hewak, Daniel W.

AU - Payne, David N.

PY - 1998/10/1

Y1 - 1998/10/1

N2 - Refractive indexes were measured for Ga2S3-La2S3 and Ga2S3-La2O3 samples in the range of 0.48-1.71 nm using the minimum deviation method. Data are analyzed by the Wemple equation, which is based on the single-oscillator model. These samples have relatively large average bandgaps, E0, and electronic oscillator strengths, Ed, in comparison with other chalcogenide glasses. Possible origins of these features are discussed.

AB - Refractive indexes were measured for Ga2S3-La2S3 and Ga2S3-La2O3 samples in the range of 0.48-1.71 nm using the minimum deviation method. Data are analyzed by the Wemple equation, which is based on the single-oscillator model. These samples have relatively large average bandgaps, E0, and electronic oscillator strengths, Ed, in comparison with other chalcogenide glasses. Possible origins of these features are discussed.

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Refractive index dispersion of gallium lanthanum sulfide and oxysulfide glasses

Abstract

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