Abstract
Refractive indexes were measured for Ga2S3-La2S3 and Ga2S3-La2O3 samples in the range of 0.48-1.71 nm using the minimum deviation method. Data are analyzed by the Wemple equation, which is based on the single-oscillator model. These samples have relatively large average bandgaps, E0, and electronic oscillator strengths, Ed, in comparison with other chalcogenide glasses. Possible origins of these features are discussed.
Original language | English |
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Pages (from-to) | 187-191 |
Number of pages | 5 |
Journal | Journal of Non-Crystalline Solids |
Volume | 239 |
Issue number | 1-3 |
DOIs | |
Publication status | Published - Oct 1 1998 |
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Ceramics and Composites
- Condensed Matter Physics
- Materials Chemistry