Refractive index dispersion of gallium lanthanum sulfide and oxysulfide glasses

Hiroyuki Yayama, Shigeru Fujino, Kenji Morinaga, Hiromichi Takebe, Daniel W. Hewak, David N. Payne

    Research output: Contribution to journalArticle

    35 Citations (Scopus)

    Abstract

    Refractive indexes were measured for Ga2S3-La2S3 and Ga2S3-La2O3 samples in the range of 0.48-1.71 nm using the minimum deviation method. Data are analyzed by the Wemple equation, which is based on the single-oscillator model. These samples have relatively large average bandgaps, E0, and electronic oscillator strengths, Ed, in comparison with other chalcogenide glasses. Possible origins of these features are discussed.

    Original languageEnglish
    Pages (from-to)187-191
    Number of pages5
    JournalJournal of Non-Crystalline Solids
    Volume239
    Issue number1-3
    DOIs
    Publication statusPublished - Oct 1 1998

    All Science Journal Classification (ASJC) codes

    • Electronic, Optical and Magnetic Materials
    • Ceramics and Composites
    • Condensed Matter Physics
    • Materials Chemistry

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