Relation between magnetoresistance and nanostructure of current-perpendicular-to-plane giant-magnetoresistance film with current-confined-path nano-oxide layer

Hiromi Yuasa, Michiko Hara, Hideaki Fukuzawa

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Nanostructure of a current-perpendicular-to-plane giant-magnetoresistance film with a current-confined-path (CCP) nano-oxide layer was analyzed by high-resolution transmission electron microscopy and three-dimensional atom probe. It was found that the CCP of a film with a higher magnetoresistance (MR) ratio has better crystalline orientation and higher purity than the CCP of a film with a smaller MR ratio. Moreover, the free layer on the CCP of a film with a high MR ratio is well crystallized. Both the CCP with the good crystalline orientation and high purity and the well-crystallized free layer diminish the diffusive electron scattering, which improves an MR ratio.

Original languageEnglish
Article number262509
JournalApplied Physics Letters
Issue number26
Publication statusPublished - Jul 11 2008
Externally publishedYes


All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)

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