Relation between the adhesion strength and interfacial width for symmetric polystyrene bilayers

Kei Ichi Akabori, Daisuke Baba, Kazuhiro Koguchi, Keiji Tanaka, Toshihiko Nagamura

    Research output: Contribution to journalArticlepeer-review

    23 Citations (Scopus)

    Abstract

    Polystyrene (PS) bilayers were prepared and were adhered at a temperature between the surface and bulk glass-transition temperatures for a given time. Then, the interfacial adhesion strength (GL) was examined with a conventional lapshear measurement. GL first increased with increasing adhesion time and then reached a constant value. This result implied that the segments moved across the interface, to a certain depth, even at a temperature below the bulk glass-transition temperature. To confirm this, the interfacial evolution for the PS/deuterated PS bilayers was examined with dynamic secondary-ion mass spectrometry. The GL value was linearly proportional to the thickness of the interfacial adhesion layer. Finally, we propose a strategy for regulating the adhesion strength based on the chain-end chemistry.

    Original languageEnglish
    Pages (from-to)3598-3604
    Number of pages7
    JournalJournal of Polymer Science, Part B: Polymer Physics
    Volume44
    Issue number24
    DOIs
    Publication statusPublished - Dec 15 2006

    All Science Journal Classification (ASJC) codes

    • Condensed Matter Physics
    • Physical and Theoretical Chemistry
    • Polymers and Plastics
    • Materials Chemistry

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