Relationship between critical current fluctuation of superconducting bicrystal junction and junction parameters

Keiji Enpuku; Tadashi Minotani; Fumio Shiraishi; Atushi Kandori

doi:10.1143/jjap.38.l433

Relationship between critical current fluctuation of superconducting bicrystal junction and junction parameters

Keiji Enpuku, Tadashi Minotani, Fumio Shiraishi, Atushi Kandori

Superconductive Systems Engineering Laboratory

Research output: Contribution to journal › Article › peer-review

Abstract

Critical current fluctuation of bicrystal junctions is estimated from the 1/f flux noise of the superconducting quantum interference device (SQUID) at T = 77 K. The relationships between the current fluctuation and junction parameters, such as critical current I_o and resistance R, are obtained. The obtained parameter dependence can be well explained by using the parameter dependence of the resistance fluctuation reported by Marx and Gross and the relationship between I_o and R obtained for the present junctions. The agreement indicates that the critical current fluctuation is correlated with the resistance fluctuation through the relationship between I_o and R.

Original language	English
Pages (from-to)	L433-L435
Journal	Japanese Journal of Applied Physics, Part 2: Letters
Volume	38
Issue number	4 B
DOIs	https://doi.org/10.1143/jjap.38.l433
Publication status	Published - 1999

All Science Journal Classification (ASJC) codes

Engineering(all)
Physics and Astronomy (miscellaneous)
Physics and Astronomy(all)

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10.1143/jjap.38.l433

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title = "Relationship between critical current fluctuation of superconducting bicrystal junction and junction parameters",

abstract = "Critical current fluctuation of bicrystal junctions is estimated from the 1/f flux noise of the superconducting quantum interference device (SQUID) at T = 77 K. The relationships between the current fluctuation and junction parameters, such as critical current Io and resistance R, are obtained. The obtained parameter dependence can be well explained by using the parameter dependence of the resistance fluctuation reported by Marx and Gross and the relationship between Io and R obtained for the present junctions. The agreement indicates that the critical current fluctuation is correlated with the resistance fluctuation through the relationship between Io and R.",

author = "Keiji Enpuku and Tadashi Minotani and Fumio Shiraishi and Atushi Kandori",

year = "1999",

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journal = "Japanese Journal of Applied Physics, Part 2: Letters",

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T1 - Relationship between critical current fluctuation of superconducting bicrystal junction and junction parameters

AU - Enpuku, Keiji

AU - Minotani, Tadashi

AU - Shiraishi, Fumio

AU - Kandori, Atushi

PY - 1999

Y1 - 1999

N2 - Critical current fluctuation of bicrystal junctions is estimated from the 1/f flux noise of the superconducting quantum interference device (SQUID) at T = 77 K. The relationships between the current fluctuation and junction parameters, such as critical current Io and resistance R, are obtained. The obtained parameter dependence can be well explained by using the parameter dependence of the resistance fluctuation reported by Marx and Gross and the relationship between Io and R obtained for the present junctions. The agreement indicates that the critical current fluctuation is correlated with the resistance fluctuation through the relationship between Io and R.

AB - Critical current fluctuation of bicrystal junctions is estimated from the 1/f flux noise of the superconducting quantum interference device (SQUID) at T = 77 K. The relationships between the current fluctuation and junction parameters, such as critical current Io and resistance R, are obtained. The obtained parameter dependence can be well explained by using the parameter dependence of the resistance fluctuation reported by Marx and Gross and the relationship between Io and R obtained for the present junctions. The agreement indicates that the critical current fluctuation is correlated with the resistance fluctuation through the relationship between Io and R.

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JF - Japanese Journal of Applied Physics, Part 2: Letters

SN - 0021-4922

IS - 4 B

ER -

Relationship between critical current fluctuation of superconducting bicrystal junction and junction parameters

Abstract

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