Abstract
Critical current fluctuation of bicrystal junctions is estimated from the 1/f flux noise of the superconducting quantum interference device (SQUID) at T = 77 K. The relationships between the current fluctuation and junction parameters, such as critical current Io and resistance R, are obtained. The obtained parameter dependence can be well explained by using the parameter dependence of the resistance fluctuation reported by Marx and Gross and the relationship between Io and R obtained for the present junctions. The agreement indicates that the critical current fluctuation is correlated with the resistance fluctuation through the relationship between Io and R.
| Original language | English |
|---|---|
| Journal | Japanese Journal of Applied Physics, Part 2: Letters |
| Volume | 38 |
| Issue number | 4 B |
| Publication status | Published - 1999 |
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All Science Journal Classification (ASJC) codes
- Physics and Astronomy (miscellaneous)
Cite this
Relationship between critical current fluctuation of superconducting bicrystal junction and junction parameters. / Enpuku, Keiji; Minotani, Tadashi; Shiraishi, Fumio; Kandori, Atushi.
In: Japanese Journal of Applied Physics, Part 2: Letters, Vol. 38, No. 4 B, 1999.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Relationship between critical current fluctuation of superconducting bicrystal junction and junction parameters
AU - Enpuku, Keiji
AU - Minotani, Tadashi
AU - Shiraishi, Fumio
AU - Kandori, Atushi
PY - 1999
Y1 - 1999
N2 - Critical current fluctuation of bicrystal junctions is estimated from the 1/f flux noise of the superconducting quantum interference device (SQUID) at T = 77 K. The relationships between the current fluctuation and junction parameters, such as critical current Io and resistance R, are obtained. The obtained parameter dependence can be well explained by using the parameter dependence of the resistance fluctuation reported by Marx and Gross and the relationship between Io and R obtained for the present junctions. The agreement indicates that the critical current fluctuation is correlated with the resistance fluctuation through the relationship between Io and R.
AB - Critical current fluctuation of bicrystal junctions is estimated from the 1/f flux noise of the superconducting quantum interference device (SQUID) at T = 77 K. The relationships between the current fluctuation and junction parameters, such as critical current Io and resistance R, are obtained. The obtained parameter dependence can be well explained by using the parameter dependence of the resistance fluctuation reported by Marx and Gross and the relationship between Io and R obtained for the present junctions. The agreement indicates that the critical current fluctuation is correlated with the resistance fluctuation through the relationship between Io and R.
UR - http://www.scopus.com/inward/record.url?scp=0032675516&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=0032675516&partnerID=8YFLogxK
M3 - Article
AN - SCOPUS:0032675516
VL - 38
JO - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
JF - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
SN - 0021-4922
IS - 4 B
ER -