Relationship between critical current fluctuation of superconducting bicrystal junction and junction parameters

Keiji Enpuku, Tadashi Minotani, Fumio Shiraishi, Atushi Kandori

Research output: Contribution to journalArticle

Abstract

Critical current fluctuation of bicrystal junctions is estimated from the 1/f flux noise of the superconducting quantum interference device (SQUID) at T = 77 K. The relationships between the current fluctuation and junction parameters, such as critical current Io and resistance R, are obtained. The obtained parameter dependence can be well explained by using the parameter dependence of the resistance fluctuation reported by Marx and Gross and the relationship between Io and R obtained for the present junctions. The agreement indicates that the critical current fluctuation is correlated with the resistance fluctuation through the relationship between Io and R.

Original languageEnglish
Pages (from-to)L433-L435
JournalJapanese Journal of Applied Physics, Part 2: Letters
Volume38
Issue number4 B
DOIs
Publication statusPublished - 1999

All Science Journal Classification (ASJC) codes

  • Engineering(all)
  • Physics and Astronomy (miscellaneous)
  • Physics and Astronomy(all)

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