Relationship between intrinsic surface resistance and critical current density of YBCO thin films with various thickness

K. Nakagawa, S. Nakayama, A. Saito, S. Ono, H. Kai, M. Mukaida, T. Honma, S. Ohshima

Research output: Contribution to journalArticle

5 Citations (Scopus)

Abstract

We investigated the relationship between the intrinsic surface resistance (Rints) and critical current density (Jc) of YBa2Cu3Oy (YBCO) film thinner than the penetration depth (kL). The measured YBCO films were deposited on CeO 2-buffered r-cut Al2O3 substrates by the pulsed laser deposition method. The thicknesses of these films were 300, 200, and 100 nm, respectively. The Rints means the surface resistance of YBCO film removing the loss by the impedance of the substrates. The effective surface resistance (Rf) including the impedance of the substrate and the J c of each YBCO film were measured using the dielectric resonator method at 21.8 GHz and the inductive method. We calculated Rint s by using phenomenological expressions and the Reff s value. The Rints values of each YBCO film were almost the same in the measured temperature region. As a result, we found that Rints was in inverse proportion to the Jc of YBCO film thinner than λL.

Original languageEnglish
Pages (from-to)1361-1364
Number of pages4
JournalPhysica C: Superconductivity and its applications
Volume470
Issue number20
DOIs
Publication statusPublished - Nov 1 2010

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Energy Engineering and Power Technology
  • Electrical and Electronic Engineering

Fingerprint Dive into the research topics of 'Relationship between intrinsic surface resistance and critical current density of YBCO thin films with various thickness'. Together they form a unique fingerprint.

  • Cite this