Relationship between microstructure and Jc property in MgB 2/α-Al2O3 film fabricated by in situ electron beam evaporation

H. Sosiati; S. Hata; N. Kuwano; Y. Tomokiyo; H. Kitaguchi; T. Doi; H. Yamamoto; A. Matsumoto; K. Saitoh; H. Kumakura

doi:10.1088/0953-2048/18/10/005

Relationship between microstructure and J_c property in MgB ₂/α-Al₂O₃ film fabricated by in situ electron beam evaporation

H. Sosiati, S. Hata, N. Kuwano, Y. Tomokiyo, H. Kitaguchi, T. Doi, H. Yamamoto, A. Matsumoto, K. Saitoh, H. Kumakura

Materials Physics and Engineering

Research output: Contribution to journal › Article › peer-review

21 Citations (Scopus)

Abstract

A transmission electron microscopy (TEM) study has been carried out on an MgB₂/α-Al₂O₃ film that exhibits the typical property of critical current density (J_c) under magnetic fields. The MgB₂ layer of 300 nm in thickness was grown on a (001)α-Al₂O₃ substrate using an in situ electron beam evaporation method. J_c of the film takes significantly high values when the applied magnetic field is perpendicular to the film surface. The MgB₂ layer consists of fine columnar MgB₂ crystals 20-30 nm in size. The columnar MgB₂ crystals grow almost perpendicular to the substrate surface and have no crystallographic orientation relationship with the α-Al₂O₃ substrate because of an amorphous layer formed first on the substrate. A high density of columnar grain boundaries within the MgB₂ layer may be effective for the enhancement of the flux-pinning under the perpendicular magnetic field.

Original language	English
Pages (from-to)	1275-1279
Number of pages	5
Journal	Superconductor Science and Technology
Volume	18
Issue number	10
DOIs	https://doi.org/10.1088/0953-2048/18/10/005
Publication status	Published - Oct 1 2005

All Science Journal Classification (ASJC) codes

Ceramics and Composites
Condensed Matter Physics
Metals and Alloys
Electrical and Electronic Engineering
Materials Chemistry

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10.1088/0953-2048/18/10/005

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title = "Relationship between microstructure and Jc property in MgB 2/α-Al2O3 film fabricated by in situ electron beam evaporation",

abstract = "A transmission electron microscopy (TEM) study has been carried out on an MgB2/α-Al2O3 film that exhibits the typical property of critical current density (Jc) under magnetic fields. The MgB2 layer of 300 nm in thickness was grown on a (001)α-Al2O3 substrate using an in situ electron beam evaporation method. Jc of the film takes significantly high values when the applied magnetic field is perpendicular to the film surface. The MgB2 layer consists of fine columnar MgB2 crystals 20-30 nm in size. The columnar MgB2 crystals grow almost perpendicular to the substrate surface and have no crystallographic orientation relationship with the α-Al2O3 substrate because of an amorphous layer formed first on the substrate. A high density of columnar grain boundaries within the MgB2 layer may be effective for the enhancement of the flux-pinning under the perpendicular magnetic field.",

author = "H. Sosiati and S. Hata and N. Kuwano and Y. Tomokiyo and H. Kitaguchi and T. Doi and H. Yamamoto and A. Matsumoto and K. Saitoh and H. Kumakura",

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T1 - Relationship between microstructure and Jc property in MgB 2/α-Al2O3 film fabricated by in situ electron beam evaporation

AU - Sosiati, H.

AU - Hata, S.

AU - Kuwano, N.

AU - Tomokiyo, Y.

AU - Kitaguchi, H.

AU - Doi, T.

AU - Yamamoto, H.

AU - Matsumoto, A.

AU - Saitoh, K.

AU - Kumakura, H.

PY - 2005/10/1

Y1 - 2005/10/1

N2 - A transmission electron microscopy (TEM) study has been carried out on an MgB2/α-Al2O3 film that exhibits the typical property of critical current density (Jc) under magnetic fields. The MgB2 layer of 300 nm in thickness was grown on a (001)α-Al2O3 substrate using an in situ electron beam evaporation method. Jc of the film takes significantly high values when the applied magnetic field is perpendicular to the film surface. The MgB2 layer consists of fine columnar MgB2 crystals 20-30 nm in size. The columnar MgB2 crystals grow almost perpendicular to the substrate surface and have no crystallographic orientation relationship with the α-Al2O3 substrate because of an amorphous layer formed first on the substrate. A high density of columnar grain boundaries within the MgB2 layer may be effective for the enhancement of the flux-pinning under the perpendicular magnetic field.

AB - A transmission electron microscopy (TEM) study has been carried out on an MgB2/α-Al2O3 film that exhibits the typical property of critical current density (Jc) under magnetic fields. The MgB2 layer of 300 nm in thickness was grown on a (001)α-Al2O3 substrate using an in situ electron beam evaporation method. Jc of the film takes significantly high values when the applied magnetic field is perpendicular to the film surface. The MgB2 layer consists of fine columnar MgB2 crystals 20-30 nm in size. The columnar MgB2 crystals grow almost perpendicular to the substrate surface and have no crystallographic orientation relationship with the α-Al2O3 substrate because of an amorphous layer formed first on the substrate. A high density of columnar grain boundaries within the MgB2 layer may be effective for the enhancement of the flux-pinning under the perpendicular magnetic field.

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JO - Superconductor Science and Technology

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Relationship between microstructure and J_c property in MgB ₂/α-Al₂O₃ film fabricated by in situ electron beam evaporation

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