Abstract
In this study, evaluation of precision in rotation stage and investigation of effect of rotation stage blurring on resolution are performed in imaging X-ray tomography set-up, which allows nano-scale observation, for the purpose of improving resolution in X-ray tomography. In the result of precision evaluation of rotation stage in high-resolution imaging X-ray tomography, fluctuation, which was approximately 35 nm in maximum and approximately 13 nm in average, was found. This fluctuation was under 1 pixel. In the simulation that analyzed effect of fluctuation in rotation stage, it was found that long periodic fluctuation deteriorate reconstructed image terribly. But, impulse-like fluctuation does not almost affect reconstructed image quality. However, reconstructed image is deteriorated when the frequency of impulse-like fluctuation increase. If long periodic fluctuation, which was observed in the precision evaluation, is corrected, the resolution improvement was confirmed though the fluctuation was less than 1 pixel.
| Original language | English |
|---|---|
| Pages (from-to) | 273-278 |
| Number of pages | 6 |
| Journal | Keikinzoku/Journal of Japan Institute of Light Metals |
| Volume | 63 |
| Issue number | 8 |
| DOIs | |
| Publication status | Published - Nov 18 2013 |
| Externally published | Yes |
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All Science Journal Classification (ASJC) codes
- Mechanics of Materials
- Mechanical Engineering
- Metals and Alloys
- Materials Chemistry
Cite this
Relationship between resolution and rotation stage in imaging X-ray CT. / Kobayashi, Masakazu; Sugihara, Yoshihiko; Toda, Hiroyuki; Uesugi, Kentaro.
In: Keikinzoku/Journal of Japan Institute of Light Metals, Vol. 63, No. 8, 18.11.2013, p. 273-278.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Relationship between resolution and rotation stage in imaging X-ray CT
AU - Kobayashi, Masakazu
AU - Sugihara, Yoshihiko
AU - Toda, Hiroyuki
AU - Uesugi, Kentaro
PY - 2013/11/18
Y1 - 2013/11/18
N2 - In this study, evaluation of precision in rotation stage and investigation of effect of rotation stage blurring on resolution are performed in imaging X-ray tomography set-up, which allows nano-scale observation, for the purpose of improving resolution in X-ray tomography. In the result of precision evaluation of rotation stage in high-resolution imaging X-ray tomography, fluctuation, which was approximately 35 nm in maximum and approximately 13 nm in average, was found. This fluctuation was under 1 pixel. In the simulation that analyzed effect of fluctuation in rotation stage, it was found that long periodic fluctuation deteriorate reconstructed image terribly. But, impulse-like fluctuation does not almost affect reconstructed image quality. However, reconstructed image is deteriorated when the frequency of impulse-like fluctuation increase. If long periodic fluctuation, which was observed in the precision evaluation, is corrected, the resolution improvement was confirmed though the fluctuation was less than 1 pixel.
AB - In this study, evaluation of precision in rotation stage and investigation of effect of rotation stage blurring on resolution are performed in imaging X-ray tomography set-up, which allows nano-scale observation, for the purpose of improving resolution in X-ray tomography. In the result of precision evaluation of rotation stage in high-resolution imaging X-ray tomography, fluctuation, which was approximately 35 nm in maximum and approximately 13 nm in average, was found. This fluctuation was under 1 pixel. In the simulation that analyzed effect of fluctuation in rotation stage, it was found that long periodic fluctuation deteriorate reconstructed image terribly. But, impulse-like fluctuation does not almost affect reconstructed image quality. However, reconstructed image is deteriorated when the frequency of impulse-like fluctuation increase. If long periodic fluctuation, which was observed in the precision evaluation, is corrected, the resolution improvement was confirmed though the fluctuation was less than 1 pixel.
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UR - http://www.scopus.com/inward/citedby.url?scp=84887477277&partnerID=8YFLogxK
U2 - 10.2464/jilm.63.273
DO - 10.2464/jilm.63.273
M3 - Article
AN - SCOPUS:84887477277
VL - 63
SP - 273
EP - 278
JO - Keikinzoku/Journal of Japan Institute of Light Metals
JF - Keikinzoku/Journal of Japan Institute of Light Metals
SN - 0451-5994
IS - 8
ER -