TY - GEN
T1 - Reliability enhancement of multilevel inverters through SVPWM-based thermal management methodology
AU - Aly, Mokhtar
AU - Dousoky, Gamal M.
AU - Shoyama, Masahito
N1 - Publisher Copyright:
© 2015 IEEE.
Copyright:
Copyright 2017 Elsevier B.V., All rights reserved.
PY - 2015/12/18
Y1 - 2015/12/18
N2 - This paper introduces design and validation of space vector pulse width modulation (SVPWM) algorithm for reliability enhancement of multilevel inverters. Thermal overheating is the main cause of shortened-lifetime and open-circuit faults of power devices. It may result from ageing of semiconductor materials due to continuous operation and various operating conditions. Degradation and faults of cooling system are also of the major causes of overheating in power components. The proposed algorithm is applied when an overheating is detected in any of the semiconductor devices and helps to alleviate the overheating from the affected device and thereby preventing the overall system from malfunction. The proposed methodology relies on using the redundancy property between the switching states in multilevel inverters to continuously evaluate a cost function of the junction temperature of the overheated devices for all possible switching sequences, then it selects the optimal relieving switching sequence. Therefore, the lifetime of the overheated device can be considerably elongated. The proposed algorithm has been designed, simulated, and experimentally validated using a T-type three-level inverter system.
AB - This paper introduces design and validation of space vector pulse width modulation (SVPWM) algorithm for reliability enhancement of multilevel inverters. Thermal overheating is the main cause of shortened-lifetime and open-circuit faults of power devices. It may result from ageing of semiconductor materials due to continuous operation and various operating conditions. Degradation and faults of cooling system are also of the major causes of overheating in power components. The proposed algorithm is applied when an overheating is detected in any of the semiconductor devices and helps to alleviate the overheating from the affected device and thereby preventing the overall system from malfunction. The proposed methodology relies on using the redundancy property between the switching states in multilevel inverters to continuously evaluate a cost function of the junction temperature of the overheated devices for all possible switching sequences, then it selects the optimal relieving switching sequence. Therefore, the lifetime of the overheated device can be considerably elongated. The proposed algorithm has been designed, simulated, and experimentally validated using a T-type three-level inverter system.
UR - http://www.scopus.com/inward/record.url?scp=84962437190&partnerID=8YFLogxK
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U2 - 10.1109/IFEEC.2015.7361605
DO - 10.1109/IFEEC.2015.7361605
M3 - Conference contribution
AN - SCOPUS:84962437190
T3 - 2015 IEEE 2nd International Future Energy Electronics Conference, IFEEC 2015
BT - 2015 IEEE 2nd International Future Energy Electronics Conference, IFEEC 2015
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2nd IEEE International Future Energy Electronics Conference, IFEEC 2015
Y2 - 1 November 2015 through 4 November 2015
ER -
