Reliability of planar waveguide photodiodes for optical subscriber systems

Hiroyasu Mawatari, Mitsuo Fukuda, Kazutoshi Kato, Tatsuya Takeshita, Masahiro Yuda, Atsuo Kozen, Hiromu Toba

Research output: Contribution to journalArticle

12 Citations (Scopus)

Abstract

This paper investigates the degradation mode and reliability of planar waveguide photodiodes (WGPD's) for the optical hybrid module for subscriber systems. From electroluminescense topography observations and current-voltage characteristics, it is clarified that the degradation mode for early failure is caused by the concentration of electric field or a microplasma at the edge of p-n junction. The condition for screening the devices likely to fail early without a bias-temperature test is determined by investigating the degradation mode. From optical beam induced current images, it is clarified that wear-out degradation, which governs the lifetime of WGPD's, occurs at the p-n junction perimeter on a cleaved facet. Estimation of activation energy, extrapolated lifetime under a practical use condition, and failure rates for wear-out and random failure show that the WGPD has sufficient reliability for optical subscriber systems.

Original languageEnglish
Pages (from-to)2428-2433
Number of pages6
JournalJournal of Lightwave Technology
Volume16
Issue number12
DOIs
Publication statusPublished - Dec 1 1998
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • Atomic and Molecular Physics, and Optics

Fingerprint Dive into the research topics of 'Reliability of planar waveguide photodiodes for optical subscriber systems'. Together they form a unique fingerprint.

  • Cite this

    Mawatari, H., Fukuda, M., Kato, K., Takeshita, T., Yuda, M., Kozen, A., & Toba, H. (1998). Reliability of planar waveguide photodiodes for optical subscriber systems. Journal of Lightwave Technology, 16(12), 2428-2433. https://doi.org/10.1109/50.736629