Abstract
The temperature dependence of electrical resistivity, ρ, was examined for the intermediate valence (IV) system EuNi2(Ge1-xSix)2. Results show that the IV compounds exhibit a characteristic peak in the ρ-T curve. The origin of the peak is discussed.
Original language | English |
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Pages (from-to) | 132-133 |
Number of pages | 2 |
Journal | Physica B: Condensed Matter |
Volume | 281-282 |
DOIs | |
Publication status | Published - Jun 1 2000 |
Externally published | Yes |
Event | Yamada Conference LI - The International Conference on Strongly Correlated Electron Systems (SCES '99) - Nagano, Jpn Duration: Aug 24 1999 → Aug 28 1999 |
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Electrical and Electronic Engineering