Resistivity anomaly due to valence transition in Eu compounds

H. Wada, A. Mitsuda, A. Nakamura, M. Shiga, J. D. Thompson

Research output: Contribution to journalConference articlepeer-review

1 Citation (Scopus)


The temperature dependence of electrical resistivity, ρ, was examined for the intermediate valence (IV) system EuNi2(Ge1-xSix)2. Results show that the IV compounds exhibit a characteristic peak in the ρ-T curve. The origin of the peak is discussed.

Original languageEnglish
Pages (from-to)132-133
Number of pages2
JournalPhysica B: Condensed Matter
Publication statusPublished - Jun 1 2000
Externally publishedYes
EventYamada Conference LI - The International Conference on Strongly Correlated Electron Systems (SCES '99) - Nagano, Jpn
Duration: Aug 24 1999Aug 28 1999

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering


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