Resonant Characteristics of High Tc DC SQUID Caused by Large Dielectric Constant of SrTiO3

Keiji Enpuku, Taku Maruo, Tadashi Minotani

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

Dynamic behavior of dc SQUID coupled to resonant circuit is studied with numerical simulation. It is shown that large rf noise flux is caused by the resonant circuit, and is added to the SQUID. This rf flux affects considerably the SQUID characteristics, e. g., appearance of resonant behavior and the increase of noise. It is also shown that a parasitic capacitance between the resonant circuit and the ground of the SQUID changes the SQUID characteristics. Therefore, it is important to suppress the rf noise flux and decrease the parasitic capacitance in order to improve the characteristics of the coupled SQUID.

Original languageEnglish
Pages (from-to)3355-3358
Number of pages4
JournalIEEE Transactions on Applied Superconductivity
Volume7
Issue number2
DOIs
Publication statusPublished - Jun 1997

Fingerprint

SQUIDs
Permittivity
direct current
permittivity
Resonant circuits
capacitance
Fluxes
Capacitance
strontium titanium oxide
simulation
Computer simulation

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

Cite this

Resonant Characteristics of High Tc DC SQUID Caused by Large Dielectric Constant of SrTiO3. / Enpuku, Keiji; Maruo, Taku; Minotani, Tadashi.

In: IEEE Transactions on Applied Superconductivity, Vol. 7, No. 2, 06.1997, p. 3355-3358.

Research output: Contribution to journalArticle

Enpuku, Keiji ; Maruo, Taku ; Minotani, Tadashi. / Resonant Characteristics of High Tc DC SQUID Caused by Large Dielectric Constant of SrTiO3. In: IEEE Transactions on Applied Superconductivity. 1997 ; Vol. 7, No. 2. pp. 3355-3358.
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