Response of an on-chip coil-integrated superconducting tunnel junction to X-rays

Keisuke Maehata, Tohru Taino, Akihito Hora, Tetsuya Ariyosh, Naoto Mori, Kenji Ishibashi, Yuzuru Matsumoto, Hiroshi Nakagawa, Hiroshi Akoh, Katsuya Kikuchi, Masahiro Aoyagi, Hiromi Sato

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

An on-chip coil-integrated superconducting tunnel junction (OC2-STJ) was irradiated by X-rays emitted from an 55Fe source to the examine the performance of X-ray detection by applying a magnetic field produced by a superconducting microstrip coil integrated into the junction chip. Response characteristics were obtained for a diamond-shaped Nb-based tunnel junction with a sensitive area of 100 × 100 μm2 in the OC2-STJ chip. Two kinds of stable operation modes with different pulse heights were observed by changing the magnetic flux density in the barrier region of the junction. In the low-pulse-height mode, the pulse height distribution exhibits two full-energy peaks corresponding to signals created in the top and base electrodes. Stable operation of the OC2-STJ was demonstrated without using conventional external electromagnets.

Original languageEnglish
Pages (from-to)2860-2863
Number of pages4
JournalJapanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
Volume42
Issue number5 A
DOIs
Publication statusPublished - May 2003

All Science Journal Classification (ASJC) codes

  • Engineering(all)
  • Physics and Astronomy(all)

Fingerprint Dive into the research topics of 'Response of an on-chip coil-integrated superconducting tunnel junction to X-rays'. Together they form a unique fingerprint.

  • Cite this

    Maehata, K., Taino, T., Hora, A., Ariyosh, T., Mori, N., Ishibashi, K., Matsumoto, Y., Nakagawa, H., Akoh, H., Kikuchi, K., Aoyagi, M., & Sato, H. (2003). Response of an on-chip coil-integrated superconducting tunnel junction to X-rays. Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 42(5 A), 2860-2863. https://doi.org/10.1143/jjap.42.2860