Response variability of isolated structure due to randomness of isolation devices

K. Hirata, H. Shiojiri, Taiji Matsuda, O. Kontani

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Abstract

Effect of randomness of restoring characteristics of an isolation device, which is considered to result from the randomness of material properties, configuration and setting error, on response of isolated structures during an earthquake is investigated. Under the given condition with respect to randomness, frequency of the eccentricity distance (distance between the center of gravity and the center of torsion of the base mat) is estimated using Monte Carlo technique and the effect of torsional response which is caused by the eccentricity is evaluated.

Original languageEnglish
Title of host publicationProc ICOSSAR 89 5th Int Conf Struct Saf Reliab
PublisherPubl by ASCE
Pages1375-1378
Number of pages4
ISBN (Print)0872627438
Publication statusPublished - 1989
Externally publishedYes
EventProceedings of ICOSSAR '89, the 5th International Conference on Structural Safety and Reliability, Part I - San Francisco, CA, USA
Duration: Aug 7 1989Aug 11 1989

Other

OtherProceedings of ICOSSAR '89, the 5th International Conference on Structural Safety and Reliability, Part I
CitySan Francisco, CA, USA
Period8/7/898/11/89

Fingerprint

Torsional stress
Materials properties
Earthquakes
Gravitation

All Science Journal Classification (ASJC) codes

  • Engineering(all)

Cite this

Hirata, K., Shiojiri, H., Matsuda, T., & Kontani, O. (1989). Response variability of isolated structure due to randomness of isolation devices. In Proc ICOSSAR 89 5th Int Conf Struct Saf Reliab (pp. 1375-1378). Publ by ASCE.

Response variability of isolated structure due to randomness of isolation devices. / Hirata, K.; Shiojiri, H.; Matsuda, Taiji; Kontani, O.

Proc ICOSSAR 89 5th Int Conf Struct Saf Reliab. Publ by ASCE, 1989. p. 1375-1378.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Hirata, K, Shiojiri, H, Matsuda, T & Kontani, O 1989, Response variability of isolated structure due to randomness of isolation devices. in Proc ICOSSAR 89 5th Int Conf Struct Saf Reliab. Publ by ASCE, pp. 1375-1378, Proceedings of ICOSSAR '89, the 5th International Conference on Structural Safety and Reliability, Part I, San Francisco, CA, USA, 8/7/89.
Hirata K, Shiojiri H, Matsuda T, Kontani O. Response variability of isolated structure due to randomness of isolation devices. In Proc ICOSSAR 89 5th Int Conf Struct Saf Reliab. Publ by ASCE. 1989. p. 1375-1378
Hirata, K. ; Shiojiri, H. ; Matsuda, Taiji ; Kontani, O. / Response variability of isolated structure due to randomness of isolation devices. Proc ICOSSAR 89 5th Int Conf Struct Saf Reliab. Publ by ASCE, 1989. pp. 1375-1378
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