Retrieval of electronic spectra of charge carriers in organic field-effect transistors from charge modulation reflectance spectra distorted by optical interference

Kiyoshi Miyata, Yuta Ishino, Kazuya Watanabe, Kazumoto Miwa, Takafumi Uemura, Jun Takeya, Yoshiyasu Matsumoto

Research output: Contribution to journalArticle

Abstract

Charge modulation (CM) spectroscopy is useful for detecting and characterizing the electronic structure of charge carriers accumulated in organic field-effect transistors (OFETs). However, CM spectra are distorted by optical interference due to multiple reflections in OFETs particularly when reflection configurations are used. In this study, we demonstrated a method for retrieving the spectra of complex refractive indices of carriers from the distorted CM spectra by using a 4 × 4 matrix algorithm with general transition matrices. We tested this method by applying it to the CM spectra of a rubrene single-crystal FET measured at several incident angles of light. In spite of the strong distortion of the CM spectra, we could retrieve the spectrum of the imaginary part of refractive indices, which is similar to that observed in the transmission configuration. This method extends the applicability of CM spectroscopy to OFETs with opaque electrodes, where transmission configurations cannot possibly be applied.

Original languageEnglish
Article number062401
JournalJapanese Journal of Applied Physics
Volume52
Issue number6 PART 1
DOIs
Publication statusPublished - Jun 1 2013
Externally publishedYes

Fingerprint

Organic field effect transistors
Light interference
Charge carriers
electronic spectra
retrieval
charge carriers
field effect transistors
Modulation
reflectance
interference
modulation
Refractive index
configurations
Spectroscopy
refractivity
Field effect transistors
spectroscopy
Electronic structure
Single crystals
electronic structure

All Science Journal Classification (ASJC) codes

  • Engineering(all)
  • Physics and Astronomy(all)

Cite this

Retrieval of electronic spectra of charge carriers in organic field-effect transistors from charge modulation reflectance spectra distorted by optical interference. / Miyata, Kiyoshi; Ishino, Yuta; Watanabe, Kazuya; Miwa, Kazumoto; Uemura, Takafumi; Takeya, Jun; Matsumoto, Yoshiyasu.

In: Japanese Journal of Applied Physics, Vol. 52, No. 6 PART 1, 062401, 01.06.2013.

Research output: Contribution to journalArticle

Miyata, Kiyoshi ; Ishino, Yuta ; Watanabe, Kazuya ; Miwa, Kazumoto ; Uemura, Takafumi ; Takeya, Jun ; Matsumoto, Yoshiyasu. / Retrieval of electronic spectra of charge carriers in organic field-effect transistors from charge modulation reflectance spectra distorted by optical interference. In: Japanese Journal of Applied Physics. 2013 ; Vol. 52, No. 6 PART 1.
@article{e521a831df9c4d0b9e90bd442c021de7,
title = "Retrieval of electronic spectra of charge carriers in organic field-effect transistors from charge modulation reflectance spectra distorted by optical interference",
abstract = "Charge modulation (CM) spectroscopy is useful for detecting and characterizing the electronic structure of charge carriers accumulated in organic field-effect transistors (OFETs). However, CM spectra are distorted by optical interference due to multiple reflections in OFETs particularly when reflection configurations are used. In this study, we demonstrated a method for retrieving the spectra of complex refractive indices of carriers from the distorted CM spectra by using a 4 × 4 matrix algorithm with general transition matrices. We tested this method by applying it to the CM spectra of a rubrene single-crystal FET measured at several incident angles of light. In spite of the strong distortion of the CM spectra, we could retrieve the spectrum of the imaginary part of refractive indices, which is similar to that observed in the transmission configuration. This method extends the applicability of CM spectroscopy to OFETs with opaque electrodes, where transmission configurations cannot possibly be applied.",
author = "Kiyoshi Miyata and Yuta Ishino and Kazuya Watanabe and Kazumoto Miwa and Takafumi Uemura and Jun Takeya and Yoshiyasu Matsumoto",
year = "2013",
month = "6",
day = "1",
doi = "10.7567/JJAP.52.062401",
language = "English",
volume = "52",
journal = "Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes",
issn = "0021-4922",
publisher = "Institute of Physics",
number = "6 PART 1",

}

TY - JOUR

T1 - Retrieval of electronic spectra of charge carriers in organic field-effect transistors from charge modulation reflectance spectra distorted by optical interference

AU - Miyata, Kiyoshi

AU - Ishino, Yuta

AU - Watanabe, Kazuya

AU - Miwa, Kazumoto

AU - Uemura, Takafumi

AU - Takeya, Jun

AU - Matsumoto, Yoshiyasu

PY - 2013/6/1

Y1 - 2013/6/1

N2 - Charge modulation (CM) spectroscopy is useful for detecting and characterizing the electronic structure of charge carriers accumulated in organic field-effect transistors (OFETs). However, CM spectra are distorted by optical interference due to multiple reflections in OFETs particularly when reflection configurations are used. In this study, we demonstrated a method for retrieving the spectra of complex refractive indices of carriers from the distorted CM spectra by using a 4 × 4 matrix algorithm with general transition matrices. We tested this method by applying it to the CM spectra of a rubrene single-crystal FET measured at several incident angles of light. In spite of the strong distortion of the CM spectra, we could retrieve the spectrum of the imaginary part of refractive indices, which is similar to that observed in the transmission configuration. This method extends the applicability of CM spectroscopy to OFETs with opaque electrodes, where transmission configurations cannot possibly be applied.

AB - Charge modulation (CM) spectroscopy is useful for detecting and characterizing the electronic structure of charge carriers accumulated in organic field-effect transistors (OFETs). However, CM spectra are distorted by optical interference due to multiple reflections in OFETs particularly when reflection configurations are used. In this study, we demonstrated a method for retrieving the spectra of complex refractive indices of carriers from the distorted CM spectra by using a 4 × 4 matrix algorithm with general transition matrices. We tested this method by applying it to the CM spectra of a rubrene single-crystal FET measured at several incident angles of light. In spite of the strong distortion of the CM spectra, we could retrieve the spectrum of the imaginary part of refractive indices, which is similar to that observed in the transmission configuration. This method extends the applicability of CM spectroscopy to OFETs with opaque electrodes, where transmission configurations cannot possibly be applied.

UR - http://www.scopus.com/inward/record.url?scp=84881043501&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84881043501&partnerID=8YFLogxK

U2 - 10.7567/JJAP.52.062401

DO - 10.7567/JJAP.52.062401

M3 - Article

AN - SCOPUS:84881043501

VL - 52

JO - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes

JF - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes

SN - 0021-4922

IS - 6 PART 1

M1 - 062401

ER -