Rigorous analysis of quantization error of an A/D converter based on β-map

Takaki Makino, Yukiko Iwata, Yutaka Jitsumatsu, Masao Hotta, Hao San, Kazuyuki Aihara

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A non-binary analog-to-digital converter (ADC) based on β-expansion, called a β-encoder, can reportedly achieve robustness against large process variation and widespread environment change. The quantization error of the β-encoder is not uniformly distributed, which makes mean squared error (MSE) evaluation difficult. In this work, an analysis method for giving the upper bound of the MSE of the quantization error is proposed. We also gave an evaluation of signal-to-noise-ratio (SNR), which is effective for designing β-encoders*.

Original languageEnglish
Title of host publication2013 IEEE International Symposium on Circuits and Systems, ISCAS 2013
Pages369-372
Number of pages4
DOIs
Publication statusPublished - Sep 9 2013
Event2013 IEEE International Symposium on Circuits and Systems, ISCAS 2013 - Beijing, China
Duration: May 19 2013May 23 2013

Publication series

NameProceedings - IEEE International Symposium on Circuits and Systems
ISSN (Print)0271-4310

Other

Other2013 IEEE International Symposium on Circuits and Systems, ISCAS 2013
CountryChina
CityBeijing
Period5/19/135/23/13

Fingerprint

Digital to analog conversion
Signal to noise ratio

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

Cite this

Makino, T., Iwata, Y., Jitsumatsu, Y., Hotta, M., San, H., & Aihara, K. (2013). Rigorous analysis of quantization error of an A/D converter based on β-map. In 2013 IEEE International Symposium on Circuits and Systems, ISCAS 2013 (pp. 369-372). [6571857] (Proceedings - IEEE International Symposium on Circuits and Systems). https://doi.org/10.1109/ISCAS.2013.6571857

Rigorous analysis of quantization error of an A/D converter based on β-map. / Makino, Takaki; Iwata, Yukiko; Jitsumatsu, Yutaka; Hotta, Masao; San, Hao; Aihara, Kazuyuki.

2013 IEEE International Symposium on Circuits and Systems, ISCAS 2013. 2013. p. 369-372 6571857 (Proceedings - IEEE International Symposium on Circuits and Systems).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Makino, T, Iwata, Y, Jitsumatsu, Y, Hotta, M, San, H & Aihara, K 2013, Rigorous analysis of quantization error of an A/D converter based on β-map. in 2013 IEEE International Symposium on Circuits and Systems, ISCAS 2013., 6571857, Proceedings - IEEE International Symposium on Circuits and Systems, pp. 369-372, 2013 IEEE International Symposium on Circuits and Systems, ISCAS 2013, Beijing, China, 5/19/13. https://doi.org/10.1109/ISCAS.2013.6571857
Makino T, Iwata Y, Jitsumatsu Y, Hotta M, San H, Aihara K. Rigorous analysis of quantization error of an A/D converter based on β-map. In 2013 IEEE International Symposium on Circuits and Systems, ISCAS 2013. 2013. p. 369-372. 6571857. (Proceedings - IEEE International Symposium on Circuits and Systems). https://doi.org/10.1109/ISCAS.2013.6571857
Makino, Takaki ; Iwata, Yukiko ; Jitsumatsu, Yutaka ; Hotta, Masao ; San, Hao ; Aihara, Kazuyuki. / Rigorous analysis of quantization error of an A/D converter based on β-map. 2013 IEEE International Symposium on Circuits and Systems, ISCAS 2013. 2013. pp. 369-372 (Proceedings - IEEE International Symposium on Circuits and Systems).
@inproceedings{0320f4b58fef410ab8cab496370afe9e,
title = "Rigorous analysis of quantization error of an A/D converter based on β-map",
abstract = "A non-binary analog-to-digital converter (ADC) based on β-expansion, called a β-encoder, can reportedly achieve robustness against large process variation and widespread environment change. The quantization error of the β-encoder is not uniformly distributed, which makes mean squared error (MSE) evaluation difficult. In this work, an analysis method for giving the upper bound of the MSE of the quantization error is proposed. We also gave an evaluation of signal-to-noise-ratio (SNR), which is effective for designing β-encoders*.",
author = "Takaki Makino and Yukiko Iwata and Yutaka Jitsumatsu and Masao Hotta and Hao San and Kazuyuki Aihara",
year = "2013",
month = "9",
day = "9",
doi = "10.1109/ISCAS.2013.6571857",
language = "English",
isbn = "9781467357609",
series = "Proceedings - IEEE International Symposium on Circuits and Systems",
pages = "369--372",
booktitle = "2013 IEEE International Symposium on Circuits and Systems, ISCAS 2013",

}

TY - GEN

T1 - Rigorous analysis of quantization error of an A/D converter based on β-map

AU - Makino, Takaki

AU - Iwata, Yukiko

AU - Jitsumatsu, Yutaka

AU - Hotta, Masao

AU - San, Hao

AU - Aihara, Kazuyuki

PY - 2013/9/9

Y1 - 2013/9/9

N2 - A non-binary analog-to-digital converter (ADC) based on β-expansion, called a β-encoder, can reportedly achieve robustness against large process variation and widespread environment change. The quantization error of the β-encoder is not uniformly distributed, which makes mean squared error (MSE) evaluation difficult. In this work, an analysis method for giving the upper bound of the MSE of the quantization error is proposed. We also gave an evaluation of signal-to-noise-ratio (SNR), which is effective for designing β-encoders*.

AB - A non-binary analog-to-digital converter (ADC) based on β-expansion, called a β-encoder, can reportedly achieve robustness against large process variation and widespread environment change. The quantization error of the β-encoder is not uniformly distributed, which makes mean squared error (MSE) evaluation difficult. In this work, an analysis method for giving the upper bound of the MSE of the quantization error is proposed. We also gave an evaluation of signal-to-noise-ratio (SNR), which is effective for designing β-encoders*.

UR - http://www.scopus.com/inward/record.url?scp=84883377818&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84883377818&partnerID=8YFLogxK

U2 - 10.1109/ISCAS.2013.6571857

DO - 10.1109/ISCAS.2013.6571857

M3 - Conference contribution

AN - SCOPUS:84883377818

SN - 9781467357609

T3 - Proceedings - IEEE International Symposium on Circuits and Systems

SP - 369

EP - 372

BT - 2013 IEEE International Symposium on Circuits and Systems, ISCAS 2013

ER -