Rigorous analysis of quantization error of an A/D converter based on β-map

Takaki Makino, Yukiko Iwata, Yutaka Jitsumatsu, Masao Hotta, Hao San, Kazuyuki Aihara

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A non-binary analog-to-digital converter (ADC) based on β-expansion, called a β-encoder, can reportedly achieve robustness against large process variation and widespread environment change. The quantization error of the β-encoder is not uniformly distributed, which makes mean squared error (MSE) evaluation difficult. In this work, an analysis method for giving the upper bound of the MSE of the quantization error is proposed. We also gave an evaluation of signal-to-noise-ratio (SNR), which is effective for designing β-encoders*.

Original languageEnglish
Title of host publication2013 IEEE International Symposium on Circuits and Systems, ISCAS 2013
Pages369-372
Number of pages4
DOIs
Publication statusPublished - 2013
Event2013 IEEE International Symposium on Circuits and Systems, ISCAS 2013 - Beijing, China
Duration: May 19 2013May 23 2013

Publication series

NameProceedings - IEEE International Symposium on Circuits and Systems
ISSN (Print)0271-4310

Other

Other2013 IEEE International Symposium on Circuits and Systems, ISCAS 2013
CountryChina
CityBeijing
Period5/19/135/23/13

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

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    Makino, T., Iwata, Y., Jitsumatsu, Y., Hotta, M., San, H., & Aihara, K. (2013). Rigorous analysis of quantization error of an A/D converter based on β-map. In 2013 IEEE International Symposium on Circuits and Systems, ISCAS 2013 (pp. 369-372). [6571857] (Proceedings - IEEE International Symposium on Circuits and Systems). https://doi.org/10.1109/ISCAS.2013.6571857