Rigorous analysis of rectangular waveguide junctions by fourier transform technique – abstract

Hongting Jia, Kuniaki Yoshitomi, Kiyotoshi Yasumoto

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

A rigorous and efficient method for characterizing rectangular waveguide junctions is presented. Using the image theory, in this method, the junction problem is transformed into an aperture problem in a uniform rectangular waveguide. The fields in the cavity region expressed by Fourier integrals are matched to those on apertures expanded by the normal modes of arm-waveguides. Then a system of linear equations with very fast convergence is obtained to determine scattering parameters of the junction. The scattering parameters are calculated for right-angle corner bends, symmetric E- and H-plane T-junctions, asymmetric E- and H-plane T-junctions, and asymmetric series E-plane T-junctions, which agree very well with literatures.

Original languageEnglish
Pages (from-to)1597-1598
Number of pages2
JournalJournal of Electromagnetic Waves and Applications
Volume12
Issue number12
DOIs
Publication statusPublished - Jan 1 1998

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Waveguide junctions
Rectangular waveguides
rectangular waveguides
Scattering parameters
Fourier transforms
Linear equations
Waveguides
apertures
linear equations
scattering
waveguides
cavities

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Physics and Astronomy(all)
  • Electrical and Electronic Engineering

Cite this

Rigorous analysis of rectangular waveguide junctions by fourier transform technique – abstract. / Jia, Hongting; Yoshitomi, Kuniaki; Yasumoto, Kiyotoshi.

In: Journal of Electromagnetic Waves and Applications, Vol. 12, No. 12, 01.01.1998, p. 1597-1598.

Research output: Contribution to journalArticle

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