Rigorous analysis of rectangular waveguide junctions by fourier transform technique – abstract

Hongting Jia, Kuniaki Yoshitomi, Kiyotoshi Yasumoto

Research output: Contribution to journalArticlepeer-review

2 Citations (Scopus)


A rigorous and efficient method for characterizing rectangular waveguide junctions is presented. Using the image theory, in this method, the junction problem is transformed into an aperture problem in a uniform rectangular waveguide. The fields in the cavity region expressed by Fourier integrals are matched to those on apertures expanded by the normal modes of arm-waveguides. Then a system of linear equations with very fast convergence is obtained to determine scattering parameters of the junction. The scattering parameters are calculated for right-angle corner bends, symmetric E- and H-plane T-junctions, asymmetric E- and H-plane T-junctions, and asymmetric series E-plane T-junctions, which agree very well with literatures.

Original languageEnglish
Pages (from-to)1597-1598
Number of pages2
JournalJournal of Electromagnetic Waves and Applications
Issue number12
Publication statusPublished - 1998

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Physics and Astronomy(all)
  • Electrical and Electronic Engineering


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