A rigorous and efficient method for characterizing rectangular waveguide junctions is presented. Using the image theory, in this method, the junction problem is transformed into an aperture problem in a uniform rectangular waveguide. The fields in the cavity region expressed by Fourier integrals are matched to those on apertures expanded by the normal modes of arm-waveguides. Then a system of linear equations with very fast convergence is obtained to determine scattering parameters of the junction. The scattering parameters are calculated for right-angle corner bends, symmetric E- and H-plane T-junctions, asymmetric E- and H-plane T-junctions, and asymmetric series E-plane T-junctions, which agree very well with literatures.
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Physics and Astronomy(all)
- Electrical and Electronic Engineering