This paper reports on the surface flattening of metal films on wafers by the thermal imprint process and its application to wafer direct bonding. The ultraflat surface of a sapphire wafer was pressed onto the surface of a sputter-deposited Au film on a Si wafer for 600 s at 200 C with an applied pressure of 5 MPa by compressed air. As a result, the Au film surface was successfully flattened by thermal imprint process. The flattened Au films were bonded in a vacuum chamber after surface activation by Ar beam sputtering. In the case of bonding between two Au films on a Si wafer, the surface flattening of the Au films was determined to be effective when the bonding load is small and/or the Au films are relatively thick. In the case of bonding between a Si wafer and a Au film on a Si wafer, defects at the bonding interface were found to be dramatically reduced by the flattening of the Au film surface. Additionally, the Au-Si bonding using the flattened Au film was significantly stronger than that without flattening.
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Condensed Matter Physics
- Surfaces, Coatings and Films
- Electrical and Electronic Engineering