Rs measurement of HTS films in millimeter wave region using dielectric resonator method

M. Kusunoki; M. Inadomaru; D. Kousaka; S. Ohshima; K. Aizawa; M. Mukaida

doi:10.1016/S0921-4534(03)01023-2

R_s measurement of HTS films in millimeter wave region using dielectric resonator method

M. Kusunoki, M. Inadomaru, D. Kousaka, S. Ohshima, K. Aizawa, M. Mukaida

Research output: Contribution to journal › Conference article › peer-review

9 Citations (Scopus)

Abstract

The parallel plate dielectric resonator was applied to surface resistance (R_s) measurement of high temperature superconducting films with small area for the purpose of material research in early stage. Using 38 GHz resonance of TE₀₁₃ mode, available measurement area in the film was diameter of 9 mm. From the theoretical calculation, the measurement at higher frequency had an advantage of less error in R_s that is caused by dielectric loss tangent (tan δ). The effect of dielectric loss is negligible at 38 GHz even using a sapphire with order of 10^-7 of tan δ. In lower R_s region, R_s values of YBa ₂Cu₃O_y that were measured at 38 GHz agreed well with that of standard measurement method at 22 GHz. However the difference of R_s between two methods became larger with increase of R _s. It is owing to poor signal to noise ratio at higher frequency.

Original language	English
Pages (from-to)	1241-1244
Number of pages	4
Journal	Physica C: Superconductivity and its applications
Volume	392-396
Issue number	PART 2
DOIs	https://doi.org/10.1016/S0921-4534(03)01023-2
Publication status	Published - Oct 1 2003
Externally published	Yes
Event	Proceedings of the 15th International Symposium on Superconduc - Yokohama, Japan Duration: Nov 11 2002 → Nov 13 2002

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Energy Engineering and Power Technology
Electrical and Electronic Engineering

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10.1016/S0921-4534(03)01023-2

Cite this

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title = "Rs measurement of HTS films in millimeter wave region using dielectric resonator method",

abstract = "The parallel plate dielectric resonator was applied to surface resistance (Rs) measurement of high temperature superconducting films with small area for the purpose of material research in early stage. Using 38 GHz resonance of TE013 mode, available measurement area in the film was diameter of 9 mm. From the theoretical calculation, the measurement at higher frequency had an advantage of less error in Rs that is caused by dielectric loss tangent (tan δ). The effect of dielectric loss is negligible at 38 GHz even using a sapphire with order of 10-7 of tan δ. In lower Rs region, Rs values of YBa 2Cu3Oy that were measured at 38 GHz agreed well with that of standard measurement method at 22 GHz. However the difference of Rs between two methods became larger with increase of R s. It is owing to poor signal to noise ratio at higher frequency.",

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T1 - Rs measurement of HTS films in millimeter wave region using dielectric resonator method

AU - Kusunoki, M.

AU - Inadomaru, M.

AU - Kousaka, D.

AU - Ohshima, S.

AU - Aizawa, K.

AU - Mukaida, M.

PY - 2003/10/1

Y1 - 2003/10/1

N2 - The parallel plate dielectric resonator was applied to surface resistance (Rs) measurement of high temperature superconducting films with small area for the purpose of material research in early stage. Using 38 GHz resonance of TE013 mode, available measurement area in the film was diameter of 9 mm. From the theoretical calculation, the measurement at higher frequency had an advantage of less error in Rs that is caused by dielectric loss tangent (tan δ). The effect of dielectric loss is negligible at 38 GHz even using a sapphire with order of 10-7 of tan δ. In lower Rs region, Rs values of YBa 2Cu3Oy that were measured at 38 GHz agreed well with that of standard measurement method at 22 GHz. However the difference of Rs between two methods became larger with increase of R s. It is owing to poor signal to noise ratio at higher frequency.

AB - The parallel plate dielectric resonator was applied to surface resistance (Rs) measurement of high temperature superconducting films with small area for the purpose of material research in early stage. Using 38 GHz resonance of TE013 mode, available measurement area in the film was diameter of 9 mm. From the theoretical calculation, the measurement at higher frequency had an advantage of less error in Rs that is caused by dielectric loss tangent (tan δ). The effect of dielectric loss is negligible at 38 GHz even using a sapphire with order of 10-7 of tan δ. In lower Rs region, Rs values of YBa 2Cu3Oy that were measured at 38 GHz agreed well with that of standard measurement method at 22 GHz. However the difference of Rs between two methods became larger with increase of R s. It is owing to poor signal to noise ratio at higher frequency.

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JO - Physica C: Superconductivity and its Applications

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Y2 - 11 November 2002 through 13 November 2002

ER -

R_s measurement of HTS films in millimeter wave region using dielectric resonator method

Abstract

All Science Journal Classification (ASJC) codes

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