Rs measurement of HTS films in millimeter wave region using dielectric resonator method

M. Kusunoki, M. Inadomaru, D. Kousaka, S. Ohshima, K. Aizawa, M. Mukaida

Research output: Contribution to journalConference article

8 Citations (Scopus)

Abstract

The parallel plate dielectric resonator was applied to surface resistance (Rs) measurement of high temperature superconducting films with small area for the purpose of material research in early stage. Using 38 GHz resonance of TE013 mode, available measurement area in the film was diameter of 9 mm. From the theoretical calculation, the measurement at higher frequency had an advantage of less error in Rs that is caused by dielectric loss tangent (tan δ). The effect of dielectric loss is negligible at 38 GHz even using a sapphire with order of 10-7 of tan δ. In lower Rs region, Rs values of YBa 2Cu3Oy that were measured at 38 GHz agreed well with that of standard measurement method at 22 GHz. However the difference of Rs between two methods became larger with increase of R s. It is owing to poor signal to noise ratio at higher frequency.

Original languageEnglish
Pages (from-to)1241-1244
Number of pages4
JournalPhysica C: Superconductivity and its applications
Volume392-396
Issue numberPART 2
DOIs
Publication statusPublished - Oct 1 2003
Externally publishedYes
EventProceedings of the 15th International Symposium on Superconduc - Yokohama, Japan
Duration: Nov 11 2002Nov 13 2002

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Energy Engineering and Power Technology
  • Electrical and Electronic Engineering

Fingerprint Dive into the research topics of 'R<sub>s</sub> measurement of HTS films in millimeter wave region using dielectric resonator method'. Together they form a unique fingerprint.

  • Cite this