Abstract
A series of Ru 0 cyclooctatetraene complexes are presented with optimal properties for MOCVD (metal organic chemical vapour deposition) applications, including combinations of the two lowest melting points and lowest decomposition temperatures yet reported for such materials. The compounds are easy to handle and lead to highly conformal thin films of Ru on SiO 2 features; even within holes with aspect ratios of 40:1. SEM, AFM and XPS studies confirm the near ideal nature of the resulting conformal thin film.
Original language | English |
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Pages (from-to) | 1678-1682 |
Number of pages | 5 |
Journal | Dalton Transactions |
Volume | 41 |
Issue number | 6 |
DOIs | |
Publication status | Published - Feb 14 2012 |
All Science Journal Classification (ASJC) codes
- Inorganic Chemistry