Scanning Type Microprobe for Displacement Measurement Based on Standing Wave Detection Using an Optically Trapped Particle

Yasuhiro Takaya, Masaki Michihata, Terutake Hayashi

Research output: Contribution to journalArticle

7 Citations (Scopus)

Abstract

The new scanning type microprobe, based on a standing wave pattern as the interferometric scale and an optically trapped microprobe as the sensing probe to read the scale, is proposed. To confirm the measurement principle the fundamental investigation was conducted experimentally and the properties such as the accuracy, the resolution and the measurable range are evaluated. The feasibility as amicro-displacement sensor is indicated by measurement results of a silicon wafer surface and a silicon sphere. In order to investigate the ability of three-dimensional measurement the scanning measurement of a micro spherical lens with a diameter of 2 mm is carried out.

Original languageEnglish
Pages (from-to)395-402
Number of pages8
JournalInternational Journal of Automation Technology
Volume5
Issue number3
DOIs
Publication statusPublished - Jan 1 2011
Externally publishedYes

Fingerprint

Displacement measurement
Scanning
Silicon wafers
Lenses
Silicon
Sensors

All Science Journal Classification (ASJC) codes

  • Mechanical Engineering
  • Industrial and Manufacturing Engineering

Cite this

Scanning Type Microprobe for Displacement Measurement Based on Standing Wave Detection Using an Optically Trapped Particle. / Takaya, Yasuhiro; Michihata, Masaki; Hayashi, Terutake.

In: International Journal of Automation Technology, Vol. 5, No. 3, 01.01.2011, p. 395-402.

Research output: Contribution to journalArticle

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