Scattering from multiple slits in a thick conducting plane

Youn S. Kim, Hyo J. Eom, Jae W. Lee, Kuniaki Yoshitomi

Research output: Contribution to journalArticle

8 Citations (Scopus)

Abstract

Electromagnetic scattering from multiple slits in a thick, perfectly conducting plane is investigated. The Fourier transform and mode matching are used to obtain the simultaneous equations. The simultaneous equations are solved to obtain a series solution which reduces to a closed form in the high‐frequency limit. The transmission coefficients are represented in fast convergent series which are efficient for numerical computations. Numerical computations are performed to illustrate their scattering behaviors in terms of frequency, slit size, and slit number.

Original languageEnglish
Pages (from-to)1341-1347
Number of pages7
JournalRadio Science
Volume30
Issue number5
DOIs
Publication statusPublished - Jan 1 1995

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simultaneous equations
slits
scattering
Scattering
conduction
Fourier transform
Fourier transforms
electromagnetic scattering
coefficients

All Science Journal Classification (ASJC) codes

  • Condensed Matter Physics
  • Earth and Planetary Sciences(all)
  • Electrical and Electronic Engineering

Cite this

Scattering from multiple slits in a thick conducting plane. / Kim, Youn S.; Eom, Hyo J.; Lee, Jae W.; Yoshitomi, Kuniaki.

In: Radio Science, Vol. 30, No. 5, 01.01.1995, p. 1341-1347.

Research output: Contribution to journalArticle

Kim, Youn S. ; Eom, Hyo J. ; Lee, Jae W. ; Yoshitomi, Kuniaki. / Scattering from multiple slits in a thick conducting plane. In: Radio Science. 1995 ; Vol. 30, No. 5. pp. 1341-1347.
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