Semiconductive α-Al2O3/Sr3Al2O6 Oxide Layer formed on Fe-Cr-Al Alloy

H. C. Pham, S. Taniguchi, Y. Inoue, J. T. Chou, K. Sasaki

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Surface oxide layer of Fe-Cr-Al alloy was investigated to apply for metal support material of SOFCs. We already found that electrical resistance of the surface oxide layer can be decreased by La0.6Sr0.4Co0.2Fe0.8O3 (LSCF) coating and heat-treatment. The morphology of the surface oxide layer changed to a columnar structure consisting of γ-Al2O3 polycrystal and Sr3Al2O6 growing outward in the same direction. In this study, we investigated heat-treatment condition to increase durability of the oxide layer. The Fe-Cr-Al alloy was firstly coated with LSCF and pre-heat treated in a vacuum at 1000oC for 1 h. Stability of mass gain and electrical resistance in air at 700oC was significantly improved. The morphology of the surface oxide layer was a complex structure consisting of α-Al2O3/Sr3Al2O6.

Original languageEnglish
Title of host publicationSolid Oxide Fuel Cells 16, SOFC 2019
EditorsK. Eguchi, S. C. Singhal
PublisherElectrochemical Society Inc.
Pages2299-2305
Number of pages7
Edition1
ISBN (Electronic)9781607688747
DOIs
Publication statusPublished - Jan 1 2019
Event16th International Symposium on Solid Oxide Fuel Cells, SOFC 2019 - Kyoto, Japan
Duration: Sep 8 2019Sep 13 2019

Publication series

NameECS Transactions
Number1
Volume91
ISSN (Print)1938-6737
ISSN (Electronic)1938-5862

Conference

Conference16th International Symposium on Solid Oxide Fuel Cells, SOFC 2019
CountryJapan
CityKyoto
Period9/8/199/13/19

All Science Journal Classification (ASJC) codes

  • Engineering(all)

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  • Cite this

    Pham, H. C., Taniguchi, S., Inoue, Y., Chou, J. T., & Sasaki, K. (2019). Semiconductive α-Al2O3/Sr3Al2O6 Oxide Layer formed on Fe-Cr-Al Alloy. In K. Eguchi, & S. C. Singhal (Eds.), Solid Oxide Fuel Cells 16, SOFC 2019 (1 ed., pp. 2299-2305). (ECS Transactions; Vol. 91, No. 1). Electrochemical Society Inc.. https://doi.org/10.1149/09101.2299ecst