Si結晶中のき裂先端近傍のHVEM/AFM観察

Kenji Higashida, Tetsuro Kawamura, Masaki Tanaka

Research output: Chapter in Book/Report/Conference proceedingEntry for encyclopedia/dictionary

Original languageJapanese
Title of host publication電子顕微鏡法の実践と応用写真集
PublisherJapan Institute of Metals (JIM)
Pages179
Number of pages1
Publication statusPublished - 2001

Cite this

Higashida, K., Kawamura, T., & Tanaka, M. (2001). Si結晶中のき裂先端近傍のHVEM/AFM観察. In 電子顕微鏡法の実践と応用写真集 (pp. 179). Japan Institute of Metals (JIM).

Si結晶中のき裂先端近傍のHVEM/AFM観察. / Higashida, Kenji; Kawamura, Tetsuro; Tanaka, Masaki.

電子顕微鏡法の実践と応用写真集. Japan Institute of Metals (JIM), 2001. p. 179.

Research output: Chapter in Book/Report/Conference proceedingEntry for encyclopedia/dictionary

Higashida, K, Kawamura, T & Tanaka, M 2001, Si結晶中のき裂先端近傍のHVEM/AFM観察. in 電子顕微鏡法の実践と応用写真集. Japan Institute of Metals (JIM), pp. 179.
Higashida K, Kawamura T, Tanaka M. Si結晶中のき裂先端近傍のHVEM/AFM観察. In 電子顕微鏡法の実践と応用写真集. Japan Institute of Metals (JIM). 2001. p. 179
Higashida, Kenji ; Kawamura, Tetsuro ; Tanaka, Masaki. / Si結晶中のき裂先端近傍のHVEM/AFM観察. 電子顕微鏡法の実践と応用写真集. Japan Institute of Metals (JIM), 2001. pp. 179
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