Simple equation for elastohydrodynamic film thickness under acceleration

J. Sugimura, T. Okumura, Y. Yamamoto, H. A. Spikes

    Research output: Contribution to journalArticlepeer-review

    26 Citations (Scopus)

    Abstract

    A simple approximation of EHD film thickness under varying speed conditions is proposed. The equation is based on continuity of flow, by which the film formed at the contact inlet moves downstream within the contact with little subsequent change in its thickness even though the boundary velocities are changing. The approximation is supported by experimental results of non-steady state film thickness measurement using ultra-thin film interferometry. It is also shown by numerical simulation that the approximation holds for film thickness in the rigid piezoviscous regime under line contact so long as the squeeze film effect is insignificant.

    Original languageEnglish
    Pages (from-to)117-123
    Number of pages7
    JournalTribology International
    Volume32
    Issue number2
    DOIs
    Publication statusPublished - Feb 1999

    All Science Journal Classification (ASJC) codes

    • Mechanics of Materials
    • Mechanical Engineering
    • Surfaces and Interfaces
    • Surfaces, Coatings and Films

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