Simple equation for elastohydrodynamic film thickness under acceleration

J. Sugimura, T. Okumura, Y. Yamamoto, H. A. Spikes

Research output: Contribution to journalArticle

25 Citations (Scopus)

Abstract

A simple approximation of EHD film thickness under varying speed conditions is proposed. The equation is based on continuity of flow, by which the film formed at the contact inlet moves downstream within the contact with little subsequent change in its thickness even though the boundary velocities are changing. The approximation is supported by experimental results of non-steady state film thickness measurement using ultra-thin film interferometry. It is also shown by numerical simulation that the approximation holds for film thickness in the rigid piezoviscous regime under line contact so long as the squeeze film effect is insignificant.

Original languageEnglish
Pages (from-to)117-123
Number of pages7
JournalTribology International
Volume32
Issue number2
DOIs
Publication statusPublished - Feb 1999

Fingerprint

elastohydrodynamics
Elastohydrodynamics
Film thickness
film thickness
approximation
squeeze films
Electrohydrodynamics
Thickness measurement
Ultrathin films
Interferometry
continuity
interferometry
Computer simulation
thin films
simulation

All Science Journal Classification (ASJC) codes

  • Mechanics of Materials
  • Mechanical Engineering
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films

Cite this

Simple equation for elastohydrodynamic film thickness under acceleration. / Sugimura, J.; Okumura, T.; Yamamoto, Y.; Spikes, H. A.

In: Tribology International, Vol. 32, No. 2, 02.1999, p. 117-123.

Research output: Contribution to journalArticle

Sugimura, J. ; Okumura, T. ; Yamamoto, Y. ; Spikes, H. A. / Simple equation for elastohydrodynamic film thickness under acceleration. In: Tribology International. 1999 ; Vol. 32, No. 2. pp. 117-123.
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