It is shown that the correction of X-ray absorption in thin-sample quantitative microanalysis does not necessarily require the measurement of foil thicknesses when the extrapolation method is used. With this method, it is sufficient to use the characteristic X-ray intensity as an alternative to the foil thickness. This method is applied to the determination of kAlNi and kTaNi factors and the microanalysis of γ and γ' phases in a Ni-Al-Ta ternary alloy.
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics