Simplification of X-ray absorption correction in thin-sample quantitative microanalysis

Zenji Horita, Takeshi Sano, Minoru Nemoto

Research output: Contribution to journalArticle

52 Citations (Scopus)

Abstract

It is shown that the correction of X-ray absorption in thin-sample quantitative microanalysis does not necessarily require the measurement of foil thicknesses when the extrapolation method is used. With this method, it is sufficient to use the characteristic X-ray intensity as an alternative to the foil thickness. This method is applied to the determination of kAlNi and kTaNi factors and the microanalysis of γ and γ' phases in a Ni-Al-Ta ternary alloy.

Original languageEnglish
Pages (from-to)271-276
Number of pages6
JournalUltramicroscopy
Volume21
Issue number3
DOIs
Publication statusPublished - Jan 1 1987

Fingerprint

X ray absorption
Microanalysis
simplification
microanalysis
Metal foil
foils
Ternary alloys
ternary alloys
Extrapolation
extrapolation
x rays
X rays

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Instrumentation

Cite this

Simplification of X-ray absorption correction in thin-sample quantitative microanalysis. / Horita, Zenji; Sano, Takeshi; Nemoto, Minoru.

In: Ultramicroscopy, Vol. 21, No. 3, 01.01.1987, p. 271-276.

Research output: Contribution to journalArticle

Horita, Zenji ; Sano, Takeshi ; Nemoto, Minoru. / Simplification of X-ray absorption correction in thin-sample quantitative microanalysis. In: Ultramicroscopy. 1987 ; Vol. 21, No. 3. pp. 271-276.
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