SIMS investigation on the effect of the interstitial moisture in metallized polymer films

Helena Téllez, José Miguel Vadillo, José Javier Laserna

Research output: Contribution to journalArticle

4 Citations (Scopus)

Abstract

Dynamic SIMS depth profiling has been used to investigate the origin of the morphological and chemical degradation of metallized polymer films. The presence of the diverse oxidized species related to the main constituents of the metallization layer has been identified in samples exhibiting large decolourated regions. The in-depth analysis of these altered regions shows high contents of oxides and hydroxyl species (AlO+ and AlOH+). By comparison with pristine regions of the same sample, it has been demonstrated the pivotal role of interstitial moisture in the formation of the oxidized species in metallized polypropylene films. Care was taken to provide sufficient charge neutralization in the sample without an excess of electron flooding that could induce water emission by electron stimulated desorption.

Original languageEnglish
Pages (from-to)669-674
Number of pages6
JournalJournal of Analytical Atomic Spectrometry
Volume25
Issue number5
DOIs
Publication statusPublished - May 10 2010

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Secondary ion mass spectrometry
Polymer films
Moisture
Depth profiling
Electrons
Polypropylenes
Metallizing
Hydroxyl Radical
Oxides
Desorption
Degradation
Water

All Science Journal Classification (ASJC) codes

  • Analytical Chemistry
  • Spectroscopy

Cite this

SIMS investigation on the effect of the interstitial moisture in metallized polymer films. / Téllez, Helena; Vadillo, José Miguel; Laserna, José Javier.

In: Journal of Analytical Atomic Spectrometry, Vol. 25, No. 5, 10.05.2010, p. 669-674.

Research output: Contribution to journalArticle

Téllez, Helena ; Vadillo, José Miguel ; Laserna, José Javier. / SIMS investigation on the effect of the interstitial moisture in metallized polymer films. In: Journal of Analytical Atomic Spectrometry. 2010 ; Vol. 25, No. 5. pp. 669-674.
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