SIMS investigation on the effect of the interstitial moisture in metallized polymer films

Helena Téllez, José Miguel Vadillo, José Javier Laserna

    Research output: Contribution to journalArticlepeer-review

    4 Citations (Scopus)

    Abstract

    Dynamic SIMS depth profiling has been used to investigate the origin of the morphological and chemical degradation of metallized polymer films. The presence of the diverse oxidized species related to the main constituents of the metallization layer has been identified in samples exhibiting large decolourated regions. The in-depth analysis of these altered regions shows high contents of oxides and hydroxyl species (AlO+ and AlOH+). By comparison with pristine regions of the same sample, it has been demonstrated the pivotal role of interstitial moisture in the formation of the oxidized species in metallized polypropylene films. Care was taken to provide sufficient charge neutralization in the sample without an excess of electron flooding that could induce water emission by electron stimulated desorption.

    Original languageEnglish
    Pages (from-to)669-674
    Number of pages6
    JournalJournal of Analytical Atomic Spectrometry
    Volume25
    Issue number5
    DOIs
    Publication statusPublished - May 10 2010

    All Science Journal Classification (ASJC) codes

    • Analytical Chemistry
    • Spectroscopy

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