Simulation test and theoretical analysis of surge propagation in superconducting magnet

B. J. Choi; S. Ohtsuka; J. Suehiro; M. Hara

doi:10.1016/0011-2275(95)98218-P

Simulation test and theoretical analysis of surge propagation in superconducting magnet

B. J. Choi, S. Ohtsuka, J. Suehiro, M. Hara

Applied Energy Engineering

Research output: Contribution to journal › Article › peer-review

2 Citations (Scopus)

Abstract

This paper deals with the surge propagation characteristics in a superconducting magnet in which arc discharge can be generated and extinguished to produce a high frequency oscillating voltage. Special attention is paid to the effects of conductor resistance in the high frequency range, which decreases with a lowering of temperature. Based on the results of simulation tests and theoretical considerations, it is shown that waveform shaping during surge travelling depends on an attenuation process due to electrical loss, as well as transmission and reflection phenomena at junctions with external circuits.

Original language	English
Pages (from-to)	505-513
Number of pages	9
Journal	Cryogenics
Volume	35
Issue number	8
DOIs	https://doi.org/10.1016/0011-2275(95)98218-P
Publication status	Published - Aug 1995

All Science Journal Classification (ASJC) codes

Materials Science(all)
Physics and Astronomy(all)

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10.1016/0011-2275(95)98218-P

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title = "Simulation test and theoretical analysis of surge propagation in superconducting magnet",

abstract = "This paper deals with the surge propagation characteristics in a superconducting magnet in which arc discharge can be generated and extinguished to produce a high frequency oscillating voltage. Special attention is paid to the effects of conductor resistance in the high frequency range, which decreases with a lowering of temperature. Based on the results of simulation tests and theoretical considerations, it is shown that waveform shaping during surge travelling depends on an attenuation process due to electrical loss, as well as transmission and reflection phenomena at junctions with external circuits.",

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